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X-Ray Diffraction and Refraction Topography of Light Weight Materials

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Nondestructive Characterization of Materials XI

Part of the book series: Advances in the statistical sciences ((ASS,volume 6))

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Abstract

For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications to low density materials are presented.

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Author information

Authors and Affiliations

  1. Federal Institute for Materials Research and Testing (BAM), Berlin, Germany

    M. P. Hentschel, A. Lange, K. -W. Harbich, J. Schors & O. Wald

Authors
  1. M. P. Hentschel
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  2. A. Lange
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  3. K. -W. Harbich
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  4. J. Schors
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  5. O. Wald
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Editor information

Editors and Affiliations

  1. Materials Science & Engineering Department, 102 Maryland Hall, Johns Hopkins University, 3400 N. Charles Street, Baltimore, MD, 21218-2689, USA

    Robert E. Green Jr.

  2. Center for Nondestructive Evaluation, Johns Hopkins University, 810 Wyman Park Drive, Suite G010, Baltimore, MD, 21211, USA

    B. Boro Djordjevic

  3. Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, 12200, Berlin, Germany

    Manfred P. Hentschel

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© 2003 Springer-Verlag Berlin Heidelberg

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Hentschel, M.P., Lange, A., Harbich, K.W., Schors, J., Wald, O. (2003). X-Ray Diffraction and Refraction Topography of Light Weight Materials. In: Green, R.E., Djordjevic, B.B., Hentschel, M.P. (eds) Nondestructive Characterization of Materials XI. Advances in the statistical sciences, vol 6. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55859-7_24

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  • DOI: https://doi.org/10.1007/978-3-642-55859-7_24

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-62481-0

  • Online ISBN: 978-3-642-55859-7

  • eBook Packages: Springer Book Archive

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