Abstract
The analysis of ENDOR spectra proceeds in the same way no matter whether the spectra were obtained by conventional stationary ENDOR, by optical detection using the MCDA technique or using luminescence or by electrical detection using the NMR and EPR-induced changes of the electrical conductivity. The ENDOR spectra often contain numerous lines. Their analysis is often not very obvious. Unfortunately, there is no direct way from the spectra to a defect model. In principle, one has to “guess” the defect model and then calculate the theoretical ENDOR spectra assuming the correct interaction tensors and the correct symmetry of the defect. This procedure is often called “fitting” of the spectra. This fit will only work if the model and all parameters are correct. Therefore, even if one would be content with interactive parameters less precise than in principle available from the spectra, it can be dangerous not to calculate the spectra with the precision determined by the experimental line resolution, since one may end up with wrong conclusions. For example, a small line splitting may be caused by a tilt of the crystal orientation during the measurement or by the so-called pseudo-dipolar coupling or by a defect symmetry lower than expected from the analysis of the EPR spectra. It will, however, not always be necessary to analyze all the lines of many shells of those distant lattice nuclei if the microscopic model can be determined from those of the nearer neighbors and that is all what was wanted.
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References
J.-M. Spaeth, R.H. Bartram, J.R. Niklas:Structural analysis of point defects in solids(Springer, Berlin, Heidelberg, New York 1992)
F. Kneubühl: Phys. Kond. Mat. 1, 410 (1963)
J. Michel, J.R. Niklas, J.-M. Spaeth: Phys. Rev. B 40, 1732 (1989)
A. Murphy, Th. Pawlik, A. Weidinger, M. Höhne, R. Alcala, J.-M. Spaeth Phys. Rev. Lett. 77, 1075 (1996)
J.-M. Spaeth: Hyperfine Interactions 32, 641 (1986)
S. Greulich-Weber, J.R. Niklas, J.-M. Spaeth: J. Phys. C: Solid State Phys. 17, L 911 (1984)
J.R. Niklas, J.-M. Spaeth: Phys. Stat. Sol. (b) 101, 221 (1980)
S. Greulich-Weber: Phys. Stat. Sol. (a) 162, 95 (1997)
S. Martini: Elektronen-Kern-Doppelresonanz und Magneto-Optik an FeAkzeptor-Paardefekten in Silizium, Doctoral Dissertation, Universität-GH Paderborn, (1995)
V.G. Grachev: JEPT 92, 1834 (1987)
V.G. Grachev: “G-symmetry and theory of ENDOR frequencies of centers with low symmetry interaction” in Radiospectroscopy of Solid State (Naukova Dumka, Kiev 1993), p. 16
D.G. McGavin, M.J. Mombourquette, J.A. Weil: “EPR:FOR” or “EPR-NMR”, Computer Programs, Dept. of Chem., Univ. of Saskatchewan (1991)
D.M. Hofmann, B.K. Meyer, F. Lohse, J.-M. Spaeth: Phys. Rev. Lett.531187 (1984)
B.K. Meyer, D.M. Hofmann, J.R. Niklas, J.-M. Spaeth: Phys. Rev. B361332 (1987)
G. Feher: Phys. Rev.1141219 and 1245 (1959)
H. Seidel: Superhyperfeinstruktur-Analyse paramagnetischer Störstellen in Kristallen mit Elektronen-Kern-Doppleresonanz (ENDOR), Habilitationsschrift, Technische Hochschule Stuttgart (1966)
J.-M. Spaeth: Z. Physik192107 (1966)
G. Corradi, H. Söthe, J.-M. Spaeth, K. Polgar: J. Phys. C: Cond. Matter26603 (1990)
H. Söthe, L.G. Rowan, J.-M.Spaeth: J. Phys. C: Cond. Matter13591 (1989)
J. Hage, J.R. Niklas, J.-M. Spaeth: Semicond. Sci. Techn.4773 (1989).
J. Hage: Magnetische Resonanzuntersuchungen an intrinsischen Defekten in bergangsmetallzentren in GaAs und GaP, Doctoral Dissertation, Universität-GH Paderborn (1987)
T.E. Feuchtwang: Phys. Rev.12589 (1962)
D. Schoemaker: Phys. Rev.1741060 (1968)
J. Hage, J.R. Niklas, J.-M. Spaeth: Mat. Sci. Forum10–12259 (1986)
I. Tkach:Optically detected magnetic resonance of Arsenic-antisite-related defects in semi-insulating bulk and low temperature MBE-grown GaAsDoctoral Dissertation, Universtiät Paderborn (2002)
R.C. DuVarney, J.R. Niklas, J.-M. Spaeth: Phys. Stat. Sol. (b)128673 (1985)
F.K. Koschnick, K. Michael, B. Beaumont, P. Gibart, J.-M. Spaeth: J. Electr. Mat.291351 (2000)
J.-M. Spaeth, K. Krambrock: Adv. in Solid State Phys.33111(1993)
H. Overhof: private communication (2002)
J.L. Ivey, R. L. Mieher: Phys. Rev. B11849 (1975)
A. v. Dujin-Arnold, R. Zontervan, J. Schmidt, P.G. Baranov, E.N. Mokhov: Phys. Rev. B64085206 (2001)
S. Greulich-Weber, M. März, J.-M. Spaeth: Physica B273–274659 (1999)
J.R. Niklas, J.-M.Spaeth: Solid State Comm.46121 (1983)
V.G. Grachev: Sov. Phys. Sold. State29413 (1987)
M.L. Falin, A.L. Konkin, M.M. Zaripov: J. Phys. C.: Cond. Matter193013 (1986)
P. Alteheld, S. Greulich-Weber, J.-M. Spaeth, H. Weihrich, H. Overhof: Phys. Rev. B524998 (1995)
R.S. Eachus, R.H.D. Nuttal, M.T. Olm, W.G. McDugle, F.K. Koschnick, Th. Hangleiter, J.-M. Spaeth: Phys. Rev. B523941 (1995)
P. Alteheld: ENDOR-Untersuchungen an Aggregatdefekten in Silizium: Die Struktur von Au-Li und Pt-Li-Komplexen, Doctoral Dissertation, Universität-GH Paderborn (1994)
C. Kevan, W. Kispert: Electron Spin Double Resonance Spectroscopy (John Wiley, Oxford, New York 1976)
T.P. Das, E.L. Hahn: “Nuclear Quadrupole Resonance Spectroscopy”, Solid State Physics Suppl. 1, (Acad. Press, New York 1958)
R. Böttcher: private communication (2002)
R. Böttcher, R. Kirmse, J. Stach: Chem. Phys. Lett.112460 (1984)
R. Böttcher, R. Kirmse, J. Stach, E.J. Reijerse, C.P. Keijzers: Chem. Phys.107145 (1986)
R. Bötttcher,D. Heinold: J. Magnetic Resonance 90, 158 (1990)
R. Böttcher, D. Heinold, W. Windsch: Chem. Phys. 93, 339 (1985)
R. Böttcher, D. Heinold: J. Magn. Reson. 90, 158 (1990)
H.G. Rist, J.S. Hyde: J. Chem. Phys. 49, 2449 (1968)
H.G. Rist, J.S. Hyde: J.Chem.Phys. 50, 4532 (1969)
H.G. Rist, J.S. Hyde: J. Chem. Phys. 52, 4633 (1970)
S. Schweizer, J.-M. Spaeth: J. Phys. Chem. Sol. 58, 859 (1997)
P.D. Moens, F.-J. Callens, P.F. Matthys, R.M. Verbeek: J. Chem. Soc. Faraday Trans. 90, 2653 (1999)
S. v. Doorslaer, F.Callens, F. Maes, E. Boesman: Phys. Rev. B 51, 12480 (1995)
K. Köhler, R. Kirmse, R. Böttcher, U. Abraham: Chem Phys. 160, 281 (1992)
G. Heder, J.R. Niklas, J.-M. Spaeth: Phys. Stat. Sol. 100, 567 (1980)
G. Heder, J.-M. Spaeth, A.H. Harker: J. Phys. C: Solid State Phys. 13, 4965 (1980)
G.W. Ludwig, Phys. Rev. 137, A 1520 (1965)
F. Beeler, M. Scheffler, O. Jepsen, O. Gunnarson: Phys. Rev. Lett. 54, 2525 (1985)
H. Overhof, M. Scheffler, C.M. Weinert: Materials Science Forum 38–41, 293 (1989); Phys. Rev. B 43, 12 494 (1991)
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Spaeth, JM., Overhof, H. (2003). Analysis of ENDOR Spectra. In: Point Defects in Semiconductors and Insulators. Springer Series in Materials Science, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55615-9_6
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DOI: https://doi.org/10.1007/978-3-642-55615-9_6
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