Abstract
In this chapter the basic features of electron paramagnetic resonance (EPR) are briefly discussed. This chapter cannot replace a textbook on EPR (for example [2.1]–[2.5]). The discussion is restricted to the fundamentals needed to understand the phenomena of electron paramagnetic resonance and nuclear magnetic resonance, and the application of EPR spectroscopy to defects in solids. Typical EPR spectra and the information gained from them for defect structures are discussed in Chap. 3. The methods of optical detection of EPR are described in Chap. 4, while their experimental aspects are described in Chap. 9.
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Spaeth, JM., Overhof, H. (2003). Fundamentals of Electron Paramagnetic Resonance. In: Point Defects in Semiconductors and Insulators. Springer Series in Materials Science, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55615-9_2
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DOI: https://doi.org/10.1007/978-3-642-55615-9_2
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-62722-4
Online ISBN: 978-3-642-55615-9
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