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High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena

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Mesoscopic Phenomena in Multifunctional Materials

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 198))

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Abstract

Transmission electron microscopy (TEM) is a particularly useful tool for studies of mesoscopic phenomena in multifunctional materials. Widely used in experiments in physics, chemistry, biology and materials science, TEM provides various methods for achieving real-space imaging of structures over a wide range of length scales, from atomic columns to macroscopic domain structures. In addition, using the interference of electron waves enables us to carry out high-resolution magnetic imaging, such as direct observation of magnetic flux lines in a thin-foil specimen and determination of important magnetic parameters (e.g., magnetocrystalline anisotropy constant) from a nanometer-scale area. In this chapter, we explain the essence of several methods related to electron microscopy, including energy-filtered electron diffraction, high-resolution TEM (methods for lattice imaging), the classical dark-field method, Lorentz microscopy, and electron holography. These methods provide essential information for a deeper understanding of mesoscopic structures produced in crystalline solids, and the mechanisms underlying material functionalities induced by the mesoscopic phenomena.

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Acknowledgments

The experimental results presented in this chapter were acquired in collaboration with researchers at Tohoku University, RIKEN, Okinawa Institute of Science and Technology (OIST), Osaka Prefecture University, Japan Science and Technology Agency (JST), Hitachi Ltd., and JEOL Co. The author expresses his sincere gratitude to Prof. D. Shindo, Prof. R. Kainuma, Prof. R. Y. Umetsu, Dr. T. Yano, Mr. K. Niitsu, Ms. S. Kidu (Tohoku), Dr. A. Tonomura (RIKEN, OIST, Hitachi), Mr. H. Kasai, Dr. J. J. Kim, Mr. S. Mamishin, Mr. K. Yanagisawa (OIST), Prof. S. Mori (Osaka), Dr. H. S. Park (RIKEN), Dr. T. Matsuda (JST), Dr. E. Okunishi, and Mr. A. Yasuhara (JEOL) for very helpful discussions regarding the topics presented in this chapter.

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  1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan

    Yasukazu Murakami

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  1. Yasukazu Murakami
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Correspondence to Yasukazu Murakami .

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  1. Theoretical Division, Los Alamos National Laboratory, Los Alamos, USA

    Avadh Saxena

  2. Estructura i Constitutents de la Matèria, Universitat de Barcelona, Barcelona, Catalonia, Spain

    Antoni Planes

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Murakami, Y. (2014). High Resolution Imaging Techniques for Understanding of Mesoscopic Phenomena. In: Saxena, A., Planes, A. (eds) Mesoscopic Phenomena in Multifunctional Materials. Springer Series in Materials Science, vol 198. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55375-2_5

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