Abstract
X-ray photoemission electron microscopy (XPEEM) is a full-field imaging technique giving access to the chemical state and magnetic order of laterally inhomogeneous surfaces, interfaces and thin films. In its simplest variant, synchrotron-based PEEM uses secondary emission to map local differences in the oxidation state, valence, and bond orientation around the emitter. The combination with X-ray circular and linear dichroism techniques represents the most frequent application, and has found extensive use in imaging ferromagnetic and antiferromagnetic domains. XPEEM instruments with energy filter can implement laterally resolved X-ray photoelectron spectroscopy (XPS) and angle resolved photoelectron spectroscopy (ARPES), reaching high chemical and electronic structure sensitivity. Here, we describe the basic aspects and methods of synchrotron-based spectromicroscopy with the PEEM, and its combination with low energy electron microscopy (LEEM). The present state of the art of the technique will be illustrated by applications in diverse fields, spanning from surface and materials sciences to biology and magnetism.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
S. Günther, B. Kaulich, L. Gregoratti, M. Kiskinova, Progr. Surf. Sci. 70(48), 187 (2002). doi:10.1016/S0079-6816(02)00007-2
J. Feng, A. Scholl, Science of Microscopy, Photoemission Electron Microscopy (PEEM) (Springer, New York, 2007)
J. Stöhr, H. Siegmann, Magnetism: From Fundamentals to Nanoscale Dynamics, vol. 152, Springer Series in Solid-State Sciences (Springer, Berlin, 2007)
E. Bauer, J. Phys.: Condens. Matter 13(49), 11391 (2001). doi:10.1088/0953-8984/13/49/316
P. Gilbert, J. Electron Spectrosc. Relat. Phenom. 185(10), 395 (2012). doi:10.1016/j.elspec.2012.06.001
E. Bauer, J. Electron Spectrosc. Relat. Phenom. 185(10), 314 (2012). doi:10.1016/j.elspec.2012.08.001
E. Bauer, Ultramicroscopy 119, 18 (2012). doi:10.1016/j.ultramic.2011.09.006
A. Locatelli, E. Bauer, J. Phys.: Condens. Matter 20(9), 093002 (2008). doi:10.1088/0953-8984/20/9/093002
G. Margaritondo, J. Electron Spectrosc. Relat. Phenom. 178–179, 273 (2010). doi:10.1016/j.elspec.2009.05.007
C.M. Schneider, A. Krasyuk, S. Nepijko, A. Oelsner, G. Schönhense, J. Magn. Magn. Mater. 304(1), 6 (2006). doi:10.1016/j.jmmm.2006.02.013
G. Schönhense, J.Electron Spectrosc. Relat. Phenom. 137–140, 769 (2004). doi:10.1016/j.elspec.2004.02.161
R. van Gastel, I. Sikharulidze, S. Schramm, J. Abrahams, B. Poelsema, Ultramicroscopy 110(1), 33 (2009). doi:10.1016/j.ultramic.2009.09.002
E. Bauer, Rep. Prog. Phys. 57(9), 895 (1994). doi:10.1088/0034-4885/57/9/002
J. Chmelik, L. Veneklasen, G. Marx, Optik 83, 155 (1989)
T. Schmidt, U. Groh, R. Fink, E. Umbach, O. Schaff, W. Engel, B. Richter, H. Kuhlenbeck, R. Schlogl, H.J. Freund, A.M. Bradshaw, D. Preikszas, P. Hartel, R. Spehr, H. Rose, G. Llilienkamp, E. Bauer, G. Benner, Surf. Rev. Lett. 09(01), 223 (2002). doi:10.1142/S0218625X02001811
W. Wan, J. Feng, H. Padmore, D. Robin, Nucl. Instrum. Methods Phys. Res. Sect. A 519(12), 222 (2004). doi:10.1016/j.nima.2003.11.159
R. Tromp, J. Hannon, A. Ellis, W. Wan, A. Berghaus, O. Schaff, Ultramicroscopy 110(7), 852 (2010). doi:10.1016/j.ultramic.2010.03.005
T. Schmidt, A. Sala, H. Marchetto, E. Umbach, H.J. Freund, Ultramicroscopy 126, 23 (2013). doi:10.1016/j.ultramic.2012.11.004
R. Tromp, J. Hannon, W. Wan, A. Berghaus, O. Schaff, Ultramicroscopy 127, 25 (2013). doi:10.1016/j.ultramic.2012.07.016
A. Locatelli, T.O. Menteş, M.Á. Niño, E. Bauer, Ultramicroscopy 111(8), 1447 (2011). doi:10.1016/j.ultramic.2010.12.020
T. Warwick, K. Franck, J.B. Kortright, G. Meigs, M. Moronne, S. Myneni, E. Rotenberg, S. Seal, W.F. Steele, H. Ade, A. Garcia, S. Cerasari, J. Denlinger, S. Hayakawa, A.P. Hitchcock, T. Tyliszczak, J. Kikuma, E.G. Rightor, H.J. Shin, B.P. Tonner, Rev. Sci. Instrum. 69(8), 2964 (1998). doi:10.1063/1.1149041
E. Bauer, Science of Microscopy, LEEM and SPLEEM (Springer, New York, 2007)
T.O. Menteş, A. Locatelli, J. Electron Spectrosc. Relat. Phenom. 185(10), 323 (2012). doi:10.1016/j.elspec.2012.07.007
T. Schmidt, S. Heun, J. Slezak, J. Diaz, K.C. Prince, G. Lilienkamp, E. Bauer, Surf. Rev. Lett. 5(6), 1287 (1998). doi:10.1142/S0218625X98001626
R. Tromp, Ultramicroscopy 120, 73 (2012). doi:10.1016/j.ultramic.2012.06.003
B.P. Tonner, G.R. Harp, Rev. Sci. Instrum. 59(6), 853 (1988). doi:10.1063/1.1139792
C.M. Schneider, G. Schönhense, Rep. Progr. Phys. 65(12), 1785 (2002)
S. Hüfner, Photoelectron Spectroscopy: Principles and Applications. Advanced Texts in Physics (Springer, Berlin, 2003)
C. Wiemann, M. Patt, S. Cramm, M. Escher, M. Merkel, A. Gloskovskii, S. Thiess, W. Drube, C.M. Schneider, Appl. Phys. Lett. 100(22), 223106 (2012). doi:10.1063/1.4722940
F.J. Meyer zu Heringdorf, T. Schmidt, S. Heun, R. Hild, P. Zahl, B. Ressel, E. Bauer, M. Horn-von Hoegen, Phys. Rev. Lett. 86, 5088 (2001). doi:10.1103/PhysRevLett.86.5088
G. Biasiol, S. Heun, L. Sorba, J. Nanoelectronics and Optoelectron. 6(1), 20–23 (2011). doi:10.1166/jno.2011.1130
T. Schmidt, J.I. Flege, S. Gangopadhyay, T. Clausen, A. Locatelli, S. Heun, J. Falta, Phys. Rev. Lett. 98, 066104 (2007). doi:10.1103/PhysRevLett.98.066104
J.T. Robinson, F. Ratto, O. Moutanabbir, S. Heun, A. Locatelli, T.O. Menteş, L. Aballe, O.D. Dubon, Nano Lett. 7(9), 2655 (2007). doi:10.1021/nl071051y
S. Suzuki, Y. Watanabe, Y. Homma, S. ya Fukuba, S. Heun, A. Locatelli, Appl. Phys. Lett. 85(1), 127 (2004). doi:10.1063/1.1768304
A. Locatelli, T. Pabisiak, A. Pavlovska, T.O. Menteş, L. Aballe, A. Kiejna, E. Bauer, J. Phys.: Condens. Matter 19(8), 082202 (2007). doi:10.1088/0953-8984/19/8/082202
T.O. Menteş, A. Locatelli, L. Aballe, A. Pavlovska, E. Bauer, T. Pabisiak, A. Kiejna, Phys. Rev. B 76, 155413 (2007). doi:10.1103/PhysRevB.76.155413
D.S. Humphrey, G. Cabailh, C.L. Pang, C.A. Muryn, S.A. Cavill, H. Marchetto, A. Potenza, S.S. Dhesi, G. Thornton, Nano Lett. 9(1), 155 (2009). doi:10.1021/nl802703e
S. Günther, A. Kolmakov, J. Kovac, M. Kiskinova, Ultramicroscopy 75(1), 35 (1998). doi:10.1016/S0304-3991(98)00047-3
A. Locatelli, M. Kiskinova, Chemistry A Eur. J. 12(35), 8890 (2006). doi:10.1002/chem.200601189
A. Schaak, S. Günther, F. Esch, E. Schütz, M. Hinz, M. Marsi, M. Kiskinova, R. Imbihl, Phys. Rev. Lett. 83, 1882 (1999). doi:10.1103/PhysRevLett.83.1882
T. Schmidt, A. Schaak, S. Günther, B. Ressel, E. Bauer, R. Imbihl, Chem. Phys. Lett. 318(6), 549 (2000). doi:10.1016/S0009-2614(00)00061-0
L. Hong, H. Uecker, M. Hinz, L. Qiao, I.G. Kevrekidis, S. Günther, T.O. Menteş, A. Locatelli, R. Imbihl, Phys. Rev. E 78, 055203 (2008). doi:10.1103/PhysRevE.78.055203
S. Günther, H. Liu, T.O. Mentes, A. Locatelli, R. Imbihl, Phys. Chem. Chem. Phys. 15, 8752 (2013). doi:10.1039/C3CP44478C
A. Locatelli, C. Sbraccia, S. Heun, S. Baroni, M. Kiskinova, J. Am. Chem. Soc. 127(7), 2351 (2005). doi:10.1021/ja045285k
Y.D. Decker, H. Marbach, M. Hinz, S. Günther, M. Kiskinova, A.S. Mikhailov, R. Imbihl, Phys. Rev. Lett. 92, 198305 (2004). doi:10.1103/PhysRevLett.92.198305
A. Locatelli, T.O. Menteş, L. Aballe, A. Mikhailov, M. Kiskinova, J. Phys. Chem. B 110(39), 19108 (2006). doi:10.1021/jp065090u
R. Imbihl, J. Electron Spectrosc. Relat. Phenom. 185(10), 347 (2012). doi:10.1016/j.elspec.2012.05.001
F. Lovis, M. Hesse, A. Locatelli, T.O. Menteş, M.A. Niño, G. Lilienkamp, B. Borkenhagen, R. Imbihl, J. Phys. Chem. C 115(39), 19149 (2011). doi:10.1021/jp206600q
L. Aballe, A. Barinov, A. Locatelli, S. Heun, M. Kiskinova, Phys. Rev. Lett. 93, 196103 (2004). doi:10.1103/PhysRevLett.93.196103
M. Altman, W. Chung, Z. He, H. Poon, S. Tong, Appl. Surf. Sci. 169–170, 82 (2001). doi:10.1016/S0169-4332(00)00644-9
N. Binggeli, M. Altarelli, Phys. Rev. Lett. 96, 036805 (2006). doi:10.1103/PhysRevLett.96.036805
L. Aballe, A. Barinov, N. Stojić, N. Binggeli, T.O. Menteş, A. Locatelli, M. Kiskinova, J. Phys.: Condens. Matter 22(1), 015001 (2010). doi:10.1088/0953-8984/22/1/015001
S. Günther, R. Reichelt, J. Wintterlin, A. Barinov, T.O. Menteş, M.Á. Niño, A. Locatelli, Appl. Phys. Lett. 93(23), 233117 (2008). doi:10.1063/1.3040685
M. Batzill, Surf. Sci. Rep. 67(34), 83 (2012). doi:10.1016/j.surfrep.2011.12.001
K.L. Man, M.S. Altman, J. Phys.: Condens. Matter 24(31), 314209 (2012). doi:10.1088/0953-8984/24/31/314209
E. Loginova, N.C. Bartelt, P.J. Feibelman, K.F. McCarty, New J. Phys. 10(9), 093026 (2008)
P. Sutter, J.I. Flege, E.A. Sutter, Nat. Mater. 7, 406 (2008). doi:10.1038/nmat2166
E. Miniussi, M. Pozzo, A. Baraldi, E. Vesselli, R.R. Zhan, G. Comelli, T.O. Menteş, M.A. Niño, A. Locatelli, S. Lizzit, D. Alfè, Phys. Rev. Lett. 106, 216101 (2011). doi:10.1103/PhysRevLett.106.216101
H. Hibino, H. Kageshima, F. Maeda, M. Nagase, Y. Kobayashi, H. Yamaguchi, Phys. Rev. B 77, 075413 (2008). doi:10.1103/PhysRevB.77.075413
A. Locatelli, K.R. Knox, D. Cvetko, T.O. Menteş, M.Á. Niño, S. Wang, M.B. Yilmaz, P. Kim, R.M. Osgood, A. Morgante, ACS Nano 4(8), 4879 (2010). doi:10.1021/nn101116n
R.M. Feenstra, N. Srivastava, Q. Gao, M. Widom, B. Diaconescu, T. Ohta, G.L. Kellogg, J.T. Robinson, I.V. Vlassiouk, Phys. Rev. B 87, 041406 (2013). doi:10.1103/PhysRevB.87.041406
K.J. Kim, H. Lee, J.H. Choi, Y.S. Youn, J. Choi, H. Lee, T.H. Kang, M.C. Jung, H.J. Shin, H.J. Lee, S. Kim, B. Kim, Adv. Mater. 20(19), 3589 (2008). doi:10.1002/adma.200800742
D. Pacilé, M. Papagno, A.F. Rodríguez, M. Grioni, L. Papagno, Ç.O. Girit, J.C. Meyer, G.E. Begtrup, A. Zettl, Phys. Rev. Lett. 101, 066806 (2008). doi:10.1103/PhysRevLett.101.066806
H.K. Jeong, H.J. Noh, J.Y. Kim, L. Colakerol, P.A. Glans, M.H. Jin, K.E. Smith, Y.H. Lee, Phys. Rev. Lett. 102, 099701 (2009). doi:10.1103/PhysRevLett.102.099701
N. Barrett, E. Conrad, K. Winkler, B. Kromker, Rev. Sci. Instrum. 83(8), 083706 (2012). doi:10.1063/1.4746279
A. Locatelli, C. Wang, C. Africh, N. Stojić, T.O. Menteş, G. Comelli, N. Binggeli, ACS Nano 7(8), 6955 (2013). doi:10.1021/nn402178u
P. Sutter, M.S. Hybertsen, J.T. Sadowski, E. Sutter, Nano Lett. 9(7), 2654 (2009). doi:10.1021/nl901040v
P. Sutter, J.T. Sadowski, E. Sutter, Phys. Rev. B 80, 245411 (2009). doi:10.1103/PhysRevB.80.245411
C. Mathieu, B. Lalmi, T.O. Menteş, E. Pallecchi, A. Locatelli, S. Latil, R. Belkhou, A. Ouerghi, Phys. Rev. B 86, 035435 (2012). doi:10.1103/PhysRevB.86.035435
K.R. Knox, S. Wang, A. Morgante, D. Cvetko, A. Locatelli, T.O. Menteş, M.Á. Niño, P. Kim, R.M. Osgood, Phys. Rev. B 78, 201408 (2008). doi:10.1103/PhysRevB.78.201408
K.R. Knox, A. Locatelli, M.B. Yilmaz, D. Cvetko, T.O. Menteş, M.Á. Niño, P. Kim, A. Morgante, R.M. Osgood, Phys. Rev. B 84, 115401 (2011). doi:10.1103/PhysRevB.84.115401
C.E. Killian, R.A. Metzler, Y. Gong, T.H. Churchill, I.C. Olson, V. Trubetskoy, M.B. Christensen, J.H. Fournelle, F. De Carlo, S. Cohen, J. Mahamid, A. Scholl, A. Young, A. Doran, F.H. Wilt, S.N. Coppersmith, P.U.P.A. Gilbert, Adv. Funct. Mater. 21(4), 682 (2011). doi:10.1002/adfm.201001546
O.H. Griffith, G.F. Rempfer, Annu. Rev. Biophys. Biophys. Chem. 14(1), 113 (1985). doi:10.1146/annurev.bb.14.060185.000553
G. de Stasio, S.F. Koranda, B.P. Tonner, G.R. Harp, D. Mercanti, M.T. Ciotti, G. Margaritondo, EPL (Europhysics Letters) 19(7), 655 (1992). doi:10.1209/0295-5075/19/7/015
C.S. Chan, G. De Stasio, S.A. Welch, M. Girasole, B.H. Frazer, M.V. Nesterova, S. Fakra, J.F. Banfield, Science 303(5664), 1656 (2004). doi:10.1126/science.1092098
R.A. Metzler, M. Abrecht, R.M. Olabisi, D. Ariosa, C.J. Johnson, B.H. Frazer, S.N. Coppersmith, P.U.P.A. Gilbert, Phys. Rev. Lett. 98, 268102 (2007). doi:10.1103/PhysRevLett.98.268102
P.U.P.A. Gilbert, A. Young, S.N. Coppersmith, Proc. Nat. Acad. Sci. 108(28), 11350 (2011). doi:10.1073/pnas.1107917108
I.C. Olson, R. Kozdon, J.W. Valley, P.U.P.A. Gilbert, J. Am. Chem. Soc. 134(17), 7351 (2012). doi:10.1021/ja210808s
G.D. Stasio, B.H. Frazer, B. Gilbert, K.L. Richter, J.W. Valley, Ultramicroscopy 98(1), 57 (2003). doi:10.1016/S0304-3991(03)00088-3
G. Schütz, W. Wagner, W. Wilhelm, P. Kienle, R. Zeller, R. Frahm, G. Materlik, Phys. Rev. Lett. 58, 737 (1987). doi:10.1103/PhysRevLett.58.737
J. Stöhr, Y. Wu, B. Hermsmeier, M. Samant, G. Harp, S. Koranda, D. Dunham, B. Tonner, Science 259, 658 (1993)
C.M. Schneider, K. Holldack, M. Kinzler, M. Grunze, H.P. Oepen, F. Schafers, H. Petersen, K. Meinel, J. Kirschner, Appl. Phys. Lett. 63(17), 2432 (1993). doi:10.1063/1.110498
F.U. Hillebrecht, T. Kinoshita, D. Spanke, J. Dresselhaus, C. Roth, H.B. Rose, E. Kisker, Phys. Rev. Lett. 75, 2224 (1995). doi:10.1103/PhysRevLett.75.2224
J. Stöhr, A. Scholl, T.J. Regan, S. Anders, J. Lüning, M.R. Scheinfein, H.A. Padmore, R.L. White, Phys. Rev. Lett. 83, 1862 (1999). doi:10.1103/PhysRevLett.83.1862
F. Nolting, A. Scholl, J. Stöhr, J.W. Seo, J. Fompeyrine, H. Siegwart, J.P. Locquet, S. Anders, J. Lüning, E.E. Fullerton, M.F. Toney, M.R. Scheinfein, H.A. Padmore, Nature 405, 767 (2000). doi:10.1038/35015515
M. Klaui, M. Laufenberg, L. Heyne, D. Backes, U. Rudiger, C.A.F. Vaz, J.A.C. Bland, L.J. Heyderman, S. Cherifi, A. Locatelli, T.O. Mentes, L. Aballe, Appl. Phys. Lett. 88(23), 232507 (2006). doi:10.1063/1.2209177
F. Cheynis, A. Masseboeuf, O. Fruchart, N. Rougemaille, J.C. Toussaint, R. Belkhou, P. Bayle-Guillemaud, A. Marty, Phys. Rev. Lett. 102, 107201 (2009). doi:10.1103/PhysRevLett.102.107201
M. Monti, B. Santos, A. Mascaraque, O. Rodriguez de la Fuente, M.A. Niño, T.O. Menteş, A. Locatelli, K.F. McCarty, J.F. Marco, J. de la Figuera, Phys. Rev. B 85, 020404 (2012). doi:10.1103/PhysRevB.85.020404
J. Raabe, C. Quitmann, C.H. Back, F. Nolting, S. Johnson, C. Buehler, Phys. Rev. Lett. 94, 217204 (2005). doi:10.1103/PhysRevLett.94.217204
J. Vogel, W. Kuch, M. Bonfim, J. Camarero, Y. Pennec, F. Offi, K. Fukumoto, J. Kirschner, A. Fontaine, S. Pizzini, Appl. Phys. Lett. 82(14), 2299 (2003). doi:10.1063/1.1564876
A. Krasyuk, A. Oelsner, S.A. Nepijko, A. Kuksov, C.M. Schneider, G. Schönhense, Appl. Phys. A: Mater. Sci. Process. 76, 863 (2003). doi:10.1007/s00339-002-1965-8
S.B. Choe, Y. Acremann, A. Scholl, A. Bauer, A. Doran, J. Stöhr, H.A. Padmore, Science 304(5669), 420 (2004). doi:10.1126/science.1095068
F. Nickel, D. Gottlob, I. Krug, H. Doganay, S. Cramm, A. Kaiser, G. Lin, D. Makarov, O. Schmidt, C. Schneider, Ultramicroscopy 130, 54 (2013). doi:10.1016/j.ultramic.2013.03.005
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2015 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Locatelli, A., Menteş, T.O. (2015). Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy. In: Mobilio, S., Boscherini, F., Meneghini, C. (eds) Synchrotron Radiation. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55315-8_21
Download citation
DOI: https://doi.org/10.1007/978-3-642-55315-8_21
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-55314-1
Online ISBN: 978-3-642-55315-8
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)