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Applications of XAFS to Nanostructures and Materials Science

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Synchrotron Radiation

Abstract

I will firstly illustrate the role and the characteristics of XAFS as a probe of the local structure in materials and nano science. I will then provide a brief review of the use of the method in these fields, basing the discussion both on results which have stood the test of time and recent papers. Specifically, I will discuss dopants and defect complexes in semiconductors, bulk and heterostructure semiconductor alloys, phase transitions, highly correlated oxides, thin films and interfaces, semiconductor quantum dots and metallic clusters.

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Author information

Authors and Affiliations

  1. Department of Physics and Astronomy, University of Bologna, Viale C. Berti Pichat 6/2, 40127, Bologna, Italy

    Federico Boscherini

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  1. Federico Boscherini
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Correspondence to Federico Boscherini .

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Editors and Affiliations

  1. Physics Department, University "Roma Tre", Roma, Italy

    Settimio Mobilio

  2. Physics Department, Bologna University, Bologna, Italy

    Federico Boscherini

  3. Physics Department, University "Roma Tre", Roma, Italy

    Carlo Meneghini

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Boscherini, F. (2015). Applications of XAFS to Nanostructures and Materials Science. In: Mobilio, S., Boscherini, F., Meneghini, C. (eds) Synchrotron Radiation. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-55315-8_17

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  • DOI: https://doi.org/10.1007/978-3-642-55315-8_17

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