Improvement of the specimen heating device for the electron microscope

Abstract

A specimen heating device for the electron microscope (1, 2) has previously been reported by us in detail, and some results (1, 2, 3, 4) were obtained applying this device. Recently, as the methods of preparing thin films of the specimen itself (5, 6, 7, 8) have made progresses, its utility has increased. But this specimen heating device for the electron microscope is not satisfactory in the following points.

• 1. On account of the asymmetric construction of the device supported from one side wall of the specimen chamber, the drift of the specimen caused by thermal expansion was very large and the time necessary to reach the thermal equilibrium was not short.

• 2. As the specimen position was placed at some distance from the pole piece of the objective, the focal length was rather long and the resolving power rather low.

• 3. The device required considerable time for exchanging the specimen, because at every time air must be admitted to the microscope column after the furnace had been cooled to room temperature. This was very inconvenient for operation.

• 4. Owing to the simplicity of the mechanism of specimen displacement, a fine control could not be obtained.