Abstract
Astigmatism was already mentioned in Ardenne’s famous book (1), but the astigmatism described therein was one of the Seidel’s aberrations of the third order and a field aberration. Axial astigmatism was more important, though it had not been well known at that time. We usually took underfocused micrographs, in which the astigmatic image defect was vague.
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References
Ardenne, M. v.: Elektronen-Übermikroskopie. Berlin: Springer 1940.
Katagiri, S., and B. Tadano: Measurement of astigmatic difference, Report of the Cooperative Research Committee on Electronmicroscopy of Japan, No. 54-A-2 (1950).
Haine, M. E., and T. Mulvey: J. sci. Instrum. 31, 326 (1954).
Leisegang, S.: Optik 11, 49 (1954).
Katagiri, S.: Rev. sci. Instrum. 26, 870 (1955).
Watanabe, H., and N. Morito: Optik 12, 166 (1955).
Morito, N.: J. appl. Physics 25, 986 (1954).
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Morito, N., Tadano, B., Katagiri, S. (1960). The development of the lens system in the Hitachi electron microscope. In: Möllenstedt, G., Niehrs, H., Ruska, E. (eds) Physikalisch-Technischer Teil. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-50195-1_17
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DOI: https://doi.org/10.1007/978-3-642-50195-1_17
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