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Interferometric Measurement of Absorption μ(E) and Dispersion ƒ’ (E) at the K Edge of Copper

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EXAFS and Near Edge Structure

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 27))

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Abstract

The variation with energy E of the X-ray absorption coefficient μ (E) and that of the anomalous dispersion correction f′ (E) at the Cu K edge have been measured under identical experimental conditions using the X-ray interferometer installed in the Hamburger Synchrotronstrahlungslabor (HASYLAB) at the storage ring DORIS at DESY.

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References

  1. U. Bonse, P. Spieker, J.-T. Hein, G. Materlik: Nucl.Inst.Meth. 172, 223–226 (1980)

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Author information

Authors and Affiliations

  1. Institut für Physik, Universität Dortmund, Postfach 50 05 00, D-4600, Dortmund 50, Fed. Rep. of Germany

    U. Bonse, I. Hartmann-Lotsch & H. Lotsch

Authors
  1. U. Bonse
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  2. I. Hartmann-Lotsch
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  3. H. Lotsch
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Editor information

Editors and Affiliations

  1. Dipartimento di Fisica, Università di Roma, La Sapienza, P. Aldo Moro 2, I-00185, Roma, Italy

    Antonio Bianconi

  2. Laboratori Nazionali di Frascati, PULS-CNR, P.O. Box 13, I-00044, Frascati, Italy

    Lucia Incoccia

  3. Laboratori Nazionali di Frascati, INFN, P.O. Box 13, I-00044, Frascati, Italy

    Stanislao Stipcich

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© 1983 Springer-Verlag Berlin Heidelberg

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Bonse, U., Hartmann-Lotsch, I., Lotsch, H. (1983). Interferometric Measurement of Absorption μ(E) and Dispersion ƒ’ (E) at the K Edge of Copper. In: Bianconi, A., Incoccia, L., Stipcich, S. (eds) EXAFS and Near Edge Structure. Springer Series in Chemical Physics, vol 27. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-50098-5_85

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  • DOI: https://doi.org/10.1007/978-3-642-50098-5_85

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-50100-5

  • Online ISBN: 978-3-642-50098-5

  • eBook Packages: Springer Book Archive

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