Abstract
The x-ray interferometer provides a very direct way of measuring x-ray forward scattering factors via the x-ray refractive index [1–3].
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References
C. Cusatis and M. Hart, Proc. Roy. Soc. A354, 291 (1977)
D. P. Siddons, Ph D Thesis, London (1979)
M. Hart and D. P. Siddons, Proc. Roy. Soc. A376, 465 (1981)
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© 1983 Springer-Verlag Berlin Heidelberg
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Siddons, D.P., Hart, M. (1983). Simultaneous Measurements of the Real and Imaginary Parts of the X-Ray Anomalous Dispersion Using X-Ray Interferometers. In: Bianconi, A., Incoccia, L., Stipcich, S. (eds) EXAFS and Near Edge Structure. Springer Series in Chemical Physics, vol 27. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-50098-5_84
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DOI: https://doi.org/10.1007/978-3-642-50098-5_84
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