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Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique pp 447–461Cite as

Kristallgitter-Strukturen

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Zusammenfassung

In der Regel werden Gitterkonstanten mit Röntgenstrahlen gemessen; da die Meßtechnik und die Auswerteverfahren außerordentlich gut durchgebildet sind, kann bei absoluten Gitterkonstantenmessungen mit Röntgenstrahlen eine Meßgenauigkeit von etwa ∆ a∕a = ± 5 • 10–5 erreicht werden. Dieser Fehler entsteht fast ausschließlich dadurch, daß die Wellenlängen der verwendeten Röntgenlinien mit einer Unsicherheit ∆ λ∕λ = ±4 • 10–5 behaftet sind (2).

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Author information

Authors and Affiliations

  1. Institut für angewandte Physik, Universität Hamburg, Deutschland

    K. Meyerhoff

  2. Chemistry Department, University of Aberdeen, Scotland

    J. A. Gard, H. F. W. Taylor & L. W. Staples

  3. Department of Geology, University of Oregon, USA

    L. W. Staples

  4. Biophysics Division, Institute of Nuclear Physics, Calcutta-9, India

    S. N. Chatterjee

  5. Research Laboratory for the Physics and Chemistry of Solids, Department of Physics, University of Cambridge, England

    M. Seal

  6. Laboratoire de Microscopie et Diffraction Electroniques, Faculté des Sciences de L’Univ., Poitiers, France

    R. Zouckermann

Authors
  1. K. Meyerhoff
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  2. J. A. Gard
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  3. H. F. W. Taylor
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  4. L. W. Staples
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  5. S. N. Chatterjee
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  6. M. Seal
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  7. R. Zouckermann
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Editor information

W. Bargmann G. Möllenstedt H. Niehrs D. Peters E. Ruska C. Wolpers

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© 1960 Springer-Verlag OHG. Berlin · Göttingen · Heidelberg

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Meyerhoff, K. et al. (1960). Kristallgitter-Strukturen. In: Bargmann, W., Möllenstedt, G., Niehrs, H., Peters, D., Ruska, E., Wolpers, C. (eds) Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-49765-0_24

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  • DOI: https://doi.org/10.1007/978-3-642-49765-0_24

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-49481-9

  • Online ISBN: 978-3-642-49765-0

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