Abstract
Free space optical interconnects are used in optoelectronic and optical networks as it is discussed in the second section of this book. A very promising scheme uses optoelectronic switching planes and optical interconnects between those planes. In the most general approach this is a more or less regular 3D-fabric of elements, this is why such a structure can be used as a symbolical example for free space interconnects. Here, we will deal with passive optical elements only which are necessary to interconnect emitters on one plane with opto-electronic detectors on the plane of the following stage.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
N. Streibl, K.-H. Brenner, A. Huang, J. Jahns, J. Jewell, A. Lohmann, D. A. B. Miller, M. Murdocca, M. E. Prise, Th. Sizer, “Digital Optics”, Proc IEEE 77, 1989, p. 1954–1969
N. Streibl, “Beam shaping with optical array generators” J. of Mod. Opt. 36, 1989, p. 1559–1573
L. Solymar, J. Cooke, “Volume holography and volume gratings”, Academic Press 1981
K. Iga, Y. Kokubun, M. Oikawa, “Fundamentals of microoptics”, Academic Press, Tokyo 1984
D. Daly, R.F. Stevens, M.C. Hutley, “The manufacture of microlenses by melting photoresist”, Meas. Sci. Technl. 1, 1990, p. 759–766
G. Schulz, J. Schwider, “Interferometric testing of smooth surfaces”, Progress in Optics 13, 1976, p. 92–167, editor E. Wolf, North Holand Publ. Amsterdam
Zygo description of phase shifting interferometer, Zygo Corp., Middlefield CT, USA
N. Abramson, “The Interferoscope a new type of interferometer with variable fringe separation”, Optik 30, 1969, p. 56
J. Schwider et al., “Semiconductor wafer and technical flat planeness testing interferometer”, Measurement 5, 1987, p. 98–101
K.G. Birch, “Oblique incidence interferometry applied to non-optical surfaces”, J. Phys. E. Sci. Instr. 1973, Volume 6, p. 1045–1048
N. Streibl, U. Mischer, J. Jahns, S. Walker, “Array generation with lenslet arrays”, Appl. Opt. 30, 1991, p. 2739–2742
H.-P. Herzig, D. Prongue, R. Dändliker, “Design and fabrication of highly efficient fan-out elements”, Proc. of the Int. Top. Meeting on “Optical Computing” in Kobe, Japan, April 1990
J. A. Cox, “Overview of diffractive optics at Honeywell”, Proc. SPIE 884, 1988 p. 127–131
J. R. Leger, M.L. Scott, P. Bundman, M.P. Griswold, “Astigmatic wavefront correction of gain-guided laser diode array using anamorphic diffractive microlenses”, Proc. SPIE 884, 1988, p. 82–89
W. Krug, J. Rienitz, G. Schulz, “Contributions to Interference Microscopy”, Hilger & Watts, 1964, London
G. Schulz, “Ein einfaches Interferenzmikroskop für Auflicht”, Naturwissenschaften 48, 1961, p. 565–566
U.-C. Minor, G. Schulz, “Über ein Auflicht-Interferenzmikroskop ohne Vergleichsfläche”, Wiss. Zeitschr. Hochsch. Elektrotechn. Ilmenau 8, 1962, p. 475–479
C. Koliopoulos, “Interferometric optical phase measurement techniques”, Thesis, 1981, Tucson OSC
Topo 3D-Interferometer-prospectus, Wyko Corp.
M. Born, E. Wolf, “Principles of Optics”, 6-th edition, Pergamon Press, 1980
J. Schwider, “Advanced evaluation techniques in interferometry”, Progress in Optics 28, 1990, p. 272–359, editor E. Wolf, North Holand Publ. Amsterdam
J. Schwider, R. Burow, K.-E. Elßner, J. Grzanna, R. Spolaczyk, K. Merkel, “Digital wavefront measuring interferometry: some systematic error sources”, Appl. Opt. 22, 1983, p. 3421–3432
G. Schulz, “Über Interferenzen gleicher Dicke und Längenmessung mit Lichtwellen”, Ann. Phys. (6) 14, 1954, p. 177–187
G. Schulz, “Über Interferenzen gleicher Dicke bei größeren Keilwinkeln und größerer Apertur”, Optik 16, 1959, p. 280–287
K. Creath, “Calibration of numerical aperture effects in interferometric microscope objectives”, Appl. Opt. 28, 1989, p. 3333–38
J. Biegen, “Calibration requirements for Mirau and Linnik microscope interferometers”, Appl. Opt. 28, 1989, p. 1972–1974
G. Schulz, K.-E. Elßner, “Errors in phase measurement interferometry with high numerical apertures”, Appl. Opt. 30, 1991, p. 4500–4506
K. Creath “Phase-Measurement Interferometry Techniques”, Prog. in Optics 26, 1988, p. 349–393
Osten, “Digitale Verarbeitung und Auswertung von Interferenzbildern”, Akademie Verlag, Berlin 1991
G. Makosch, B. Solf, “Surface profiling by electro-optical phase measurements”, Proc. SPIE Vol. 316, 1981
C. C. Huang, “Optical heterodyne profilometer”, Opt. Eng. 23, 1984, p. 365
J. C. Wyant, K. Creath, “Recent advances in interferometric optical testing”, Laser Focus/Electrooptics 21, Nov. 1985, p. 118–132
W. Kösters, “Anwendung der Interferenzen zu Messzwecken”, Handbuch der physikalischen Optik Bd.1, p. 471–498, ed. E. Gehrcke, Leipzig 1927, J.A. Barth
Y.-Y. Cheng, J.C. Wyant, “Two-wavelength phase shifting interferometry”, Appl. Opt. 23, 1984, p. 4539–4543
K. Creath, “Step height measurement using two-wavelength phase-shifting interferometry”, Appl.Opt. 26, 1987, p. 2810–2816
Talystep, Taylor & Hobson, Instrument description, 1987
Rodenstock, Laser Stylus RM 600
D. Rugar, P Hansma, “Atomic force microscopy”, Phys. Today, Oct 1990, p. 23–30
D. Sarid, “Scanning force microscopy with appliocations to electric, magnertic, atomic forces”, Oxford University Press, New York, 1991
T. W. Cline, R. B. Jander, “Wavefront aberration measurements on Grin-rod lenses”, Appl. Opt. 21, 1982, p. 1035–1041
J. Schwider, K.-E. Elssner, J. Grzanna, R. Spolaczyk, “Results and error sources in absolute sphericity measurements”, IMEKO Laser Measurement Working Group Symposium Budapest, November 1986
O. Falkenstörfer, H. Kobolla, U. Krackhardt, N. Lindlein, J. Schwider, N. Streibl, R. Völkel, H. Weißmann, “Optimization of holographic lenslets and their measurement”, IOP Short meeting on Microlens Arrays, Teddington 1. May 1991, p. 53–60
M.C. Hutley, D. Daly, R.F. Stevens, “The testing of microlens arrays”, Proc. IOP-Short-meeting on “Microlens arrays”, 1.May 1991 Teddington, Institute of Physics Series No. 30, p. 67–81
O’Neill, “Introduction to statistical optics”, 1963, Read. Mass.
K. Murata, “Instruments for the measuring of optical transfer functions”, Prog. in Optics vol. V, ed. E. Wolf, North Holland publ. House, 1966
D. Malacara, “Optical shop testing”, J. Wiley & Sons, 1978, New York
D. Prongue, H. P. Herzig, “Design and fabrication of HOE for clock distribution in integrated circuits”, Conference Proceedings “Holographic Systems, Components and Applications”, Bath, Sept. 1989
H.-P. Herzig; “Holographic optical elements (HOE) for semiconductor lasers”, Opt. Comm. 58, 1986, p. 144–148
K. Hamanaka, H. Nemoto, M. Oikawa, E. Okuda, T. Kishimoto, “Multiple imaging and multiple Fourier transformation using planar microlens arrays”, Appl. Opt. 29, 1990, p. 4064–4070
R. R. A. Syms, “Practical volume holography”, Clarendon Press, Oxford 1990
H. Kogelnik, “Coupled wave theory for thick hologram gratings”, Bell Syst. Techn. Journ. 48, 1969, p. 2909
G.R. Chamberlin, D.E. Sheat, A.M. Hill, “Holographic transmission gratings for use in the 1250–1600 fibre window”, Conference Proceedings “Holographic Systems, Components and Applications”, Bath, Sept. 1989
G. Birnbaum, C.M. Vest, “Holographic nondestructive evaluation: status and future. Int. Adv. in Nondestr. Test. 9, 1983, p. 257–282
Y. Kokubun, K. Iga, “Index profiling of distributed-index lenses by a shearing interference method”, Appl. Opt. 21, 1982, p. 1030–1034
Y. Kokubun, T. Usui, M. Oikawa, K. Iga, “Wave aberration testing system for micro-lenses by shearing interference method”, Jap. J. Appl. Phys. 23, 1984, p. 101–104.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1993 ECSC — EEC — EAEC, Brussels — Luxembourg
About this chapter
Cite this chapter
Schwider, J. (1993). Characterization of Interconnection Components. In: Lalanne, P., Chavel, P. (eds) Perspectives for Parallel Optical Interconnects. ESPRIT Basic Research Series. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-49264-8_6
Download citation
DOI: https://doi.org/10.1007/978-3-642-49264-8_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-49266-2
Online ISBN: 978-3-642-49264-8
eBook Packages: Springer Book Archive