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Analytical Electron Microscopy in Surface Science

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Chemistry and Physics of Solid Surfaces IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 20))

Abstract

Several surface science techniques use electrons. They are used either as a probe of the surface, or as the emitted particles, as for example in photoemission, or sometimes both, such as in Auger electron spectroscopy. Electron microscopy techniques use magnetic fields (typically with axial symmetry) to focus electron beams to a fine spot and/or to preserve information as to the point of origin of the electrons.

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Venables, J.A. (1982). Analytical Electron Microscopy in Surface Science. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces IV. Springer Series in Chemical Physics, vol 20. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-47495-8_6

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