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Various Electromagnetic Phenomena

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Flux Pinning in Superconductors

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 178))

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Abstract

Chapter 3 covers various electromagnetic phenomena. These include geometrical effects and dynamic phenomena that were not treated in Chap. 2. The rectifying effect in the DC current-voltage characteristics in a superposed AC magnetic field, flux jumps, surface irreversibility, and DC susceptibility in a varying temperature are also included. In addition, it is shown that an abnormal reduction in losses occurs, deviating from the prediction of the critical state model when an AC magnetic field is applied to a superconductor smaller than the pinning correlation length called Campbell’s AC penetration depth. This is attributed to the reversible motion of flux lines limited within pinning potential wells. In high-temperature superconductors the superconducting current sustained by flux pinning appreciably decays with time due to the thermal agitation of flux lines. This phenomenon, which is called flux creep, is also discussed. In extreme cases the critical current density is reduced to zero at some magnetic field called the irreversibility field. The principles used to determine the irreversibility field are described, and the result is applied to high-temperature superconductors in Chap. 8.

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Notes

  1. 1.

    As to the magnetic field dependence of surface critical current density, see [31].

  2. 2.

    In practice, even if we try to instantaneously establish an ideal external condition such as magnetic field before the flux creep starts, the relaxation due to the viscosity shown in Sect. 3.2 is added. Hence, the condition in Fig. 3.44(b) is not realized in a strict sense. However, the results after a sufficient long time do not seem to depend sensitively on the initial condition as usually observed, and the above assumption will be admitted.

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Matsushita, T. (2014). Various Electromagnetic Phenomena. In: Flux Pinning in Superconductors. Springer Series in Solid-State Sciences, vol 178. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45312-0_3

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