A Scan Chain Based SEU Test Method for Microprocessors
A test method based on the scan chain technique is proposed to evaluate the single event upset performance for all the flip-flops in the microprocessors. The single event upset (SEU) performance of a digital signal processor is evaluated using the proposed method and program test method with different working frequencies. Heavy ion irradiation experiment results show that this method is able to capture all the SEUs in the whole chip with no escape and has few infections from the single event transients, which is helpful to study the SEUs precisely in the complicated processors.
Keywordssingle event upset scan chain microprocessor heavy ion
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