Abstract
As an important part of EMC, EFT performance at IC level is drawing more and more attentions from IC designers and product engineers. But there is no EFT test standard at IC level exist. CIIM is an influential method proposed for EFT test at IC level and is introduced in this paper. However, this test method is not so perfect and still needs to be improved. Two probes with different internal resistance are tested on a microcontroller to investigate the reproducibility and repeatability issue of the test. It can be very beneficial to the improvement of CIIM test method and the progress of standardization on EFT test at IC level.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
IEC 61967: Integrated circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz. Standard, International Electro-Technical Commission (2004)
IEC 62132: Integrated circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz. Standard, International Electro-Technical Commission (2004)
IEC 62215: Integrated circuits - Measurement of Impulse Immunity. Standard Proposal, International Electro-Technical Commission (2005)
Auderer, G.: Conducted Impulse Injection Method (CIIM). In: Proceedings of the 5th International Workshop on Electromagnetic Compatibility of Integrated Circuits (2005)
Musolino, F., Fiori, F.: Investigation on the susceptibility of microcontrollers to EFT interference. In: IEEE International Symposium on Electromagnetic Compatibility, pp. 410–413. IEEE Press, Chicago (2005)
Deutschmann, B., Langer, G., Auderer, G.: Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances, http://www.langer-emv.de
Guideline IC EFT test, http://www.langer-emv.de
IEC 61000-4-4, Electromagnetic Compatibility (EMC)-Part 4-4: Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test. Standard, International Electro-technical Commission (2001)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Su, J., Li, J., Wu, J., Wang, C. (2013). Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers. In: Xu, W., Xiao, L., Zhang, C., Li, J., Yu, L. (eds) Computer Engineering and Technology. NCCET 2013. Communications in Computer and Information Science, vol 396. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-41635-4_18
Download citation
DOI: https://doi.org/10.1007/978-3-642-41635-4_18
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-41634-7
Online ISBN: 978-3-642-41635-4
eBook Packages: Computer ScienceComputer Science (R0)