Abstract
Material characterization in the wide field of optoelectronics often involves ellipsometric measurements. A deep knowledge of the sample properties, including anisotropy, is required for successful material analysis via optical modeling. This appendix provides thin-film optical constants n and k for commonly used organic materials used for transparent electrodes, solar cells, etc.
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© 2014 Springer-Verlag Berlin Heidelberg
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Furchner, A., Aulich, D. (2014). Organic Materials for Optoelectronic Applications. In: Hinrichs, K., Eichhorn, KJ. (eds) Ellipsometry of Functional Organic Surfaces and Films. Springer Series in Surface Sciences, vol 52. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40128-2_18
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DOI: https://doi.org/10.1007/978-3-642-40128-2_18
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-40127-5
Online ISBN: 978-3-642-40128-2
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