Abstract
A major factor for the achievement of the required performance, efficiency and lifetime of organic electronic (OE) devices (Organic Photovoltaics—OPVs, Organic Light Emitting Diodes—OLEDs, etc.) is the quality control of the substrates, active layers, barrier materials and transparent electrode nanolayers that are used for the fabrication of these devices. The in-line optical characterization and modeling of the optical and electrical properties of the above nanolayers can give valuable information of the growth mechanisms and the structure-property relationships that can play a major role towards the optimization of the nanolayers performance. Also, the capability for in-line monitoring, at every single step, of the optical properties and the quality of the fabricated nanolayers, e.g. by roll-to-roll (r2r) process, will improve the process yield opening the way for the low cost fabrication of OE devices.
In this chapter, we will discuss in detail the latest advances on the combination of optical sensing by Spectroscopic Ellipsometry with the processes (vacuum deposition, r2r printing) for fabrication of OE nanolayers and devices. These advances include the results of the determination of the optical constants, composition, refractive index, thickness with nm precision, stability and the uniformity of the OE nanolayers onto rigid (e.g. c-Si, glass) and flexible (as Polyethylene Terephthalate—PET) substrates.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
D.M. de Leeuw, E. Cantatore, Mater. Sci. Semicond. Process. 11, 199 (2008)
F.C. Krebs, Org. Electron. 10, 761 (2009)
M. Cavallini, M. Facchini, M. Massi, F. Biscarini, Synth. Met. 146, 283 (2004)
P. Kopola, T. Aernouts, R. Sliz, S. Guillerez, M. Ylikunnari, D. Cheyns, M. Välimäki, M. Tuomikoski, J. Hast, G. Jabbour, R. Myllylä, A. Maaninen, Sol. Energy Mater. Sol. Cells 95, 1344 (2011)
S. Logothetidis, Mater. Sci. Eng. B 152, 96 (2008)
S. Logothetidis, A. Laskarakis, Eur. Phys. J. Appl. Phys. 46, 12502 (2009)
White Paper OE—A Roadmap (2011)
P. Kumar, S. Chand, Prog. Photovolt. 20(4), 377 (2012)
A. Laskarakis, S. Logothetidis, J. Appl. Phys. 99, 066101 (2006)
A. Laskarakis, S. Logothetidis, J. Appl. Phys. 101, 053503 (2007)
S. Logothetidis, in Thin Films Handbook, ed. by H.S. Nalwa (Academic Press, New York, 2001)
V.G. Kechagias, M. Gioti, S. Logothetidis, R. Benferhat, D. Teer, Thin Solid Films 364, 213 (2000)
S. Logothetidis, A. Laskarakis, A. Gika, P. Patsalas, Surf. Coat. Technol. 152, 204 (2002)
G.E. Irene, H.G. Tompkins (eds.), Handbook of Ellipsometry (William Andrew, Norwich, 2005)
A. Laskarakis, S. Kassavetis, C. Gravalidis, S. Logothetidis, Nucl. Instrum. Methods Phys. Res., Sect. B, Beam Interact. Mater. Atoms 268, 460 (2010)
M. Gioti, S. Logothetidis, C. Charitidis, Y. Panayiotatos, I. Varsano, Sens. Actuators 99, 35 (2002)
R.W. Collins, J. Koh, H. Fujiwara, P.I. Rovira, A.S. Ferlauto, J.A. Zapien, C.R. Wronski, R. Messier, Appl. Surf. Sci. 154–155, 217 (2000)
A. Laskarakis, S. Logothetidis, S. Kassavetis, E. Papaioannou, Thin Solid Films 516, 1443 (2008)
19, L.R. Dahal, Z. Huang, D. Attygalle, M.N. Sestak, C. Salupo, S. Marsillac, R.W. Collins, in 35th IEEE Photovoltaic Specialists Conference, 000631 (2010)
K. Heymann, G. Mirschel, T. Scherzer, M. Buchmeiser, Vib. Spectrosc. 51, 152 (2009)
B. Schmidt-Hansberg, M.F.G. Klein, K. Peters, F. Buss, J. Pfeifer, S. Walheim, A. Colsmann, U. Lemmer, P. Scharfer, W. Schabel, J. Appl. Phys. 106, 124501 (2009)
S. Logothetidis, Method for the in-situ and real-time determination of the thickness, optical properties and quality of transparent coatings during their growth onto polymeric substrates and determination of the modification, activation and the modification depth of polym. U.S. Patent 7,777,882, 2010
S. Logothetidis, Method for in-line determination of film thickness and quality during printing processes for the production of organic electronics. U.S. Patent PCT/GR2011/000018, 2011
S. Logothetidis, D. Georgiou, A. Laskarakis, C. Koidis, N. Kalfagiannis, Sol. Energy Mater. Sol. Cells 112, 144 (2013)
J. Noh, D. Yeom, C. Lim, H. Cha, J. Han, J. Kim, Y. Park, V. Subramanian, G. Cho, IEEE Trans. Electron. Packag. Manuf. 33, 275 (2010)
Y.-J. Cheng, S.-H. Yang, C.-S. Hsu, Chem. Rev. 109, 5868 (2009)
C.-Y. Lo, J. Hiitola-Keinänen, O.-H. Huttunen, J. Petäjä, J. Hast, A. Maaninen, H. Kopola, H. Fujita, H. Toshiyoshi, Microelectron. Eng. 86, 979 (2009)
C. Koidis, S. Logothetidis, S. Kassavetis, C. Kapnopoulos, P.G. Karagiannidis, D. Georgiou, A. Laskarakis, Sol. Energy Mater. Sol. Cells 112, 36 (2013)
A. Laskarakis, S. Logothetidis, M. Gioti, Phys. Rev. 64, 1 (2001)
C. Chen, M.W. Horn, S. Pursel, C. Ross, R.W. Collins, Applied Surface Science 253(38) (2006)
S. Logothetidis, M. Gioti, P. Patsalas, Diam. Relat. Mater. 10, 117 (2001)
C. Gravalidis, M. Gioti, A. Laskarakis, S. Logothetidis, Surf. Coat. Technol. 181, 655 (2004)
M. Gioti, S. Logothetidis, P. Patsalas, A. Laskarakis, Y. Panayiotatos, V. Kechagias, Surf. Coat. Technol. 125, 289 (2000)
C. Koidis, S. Logothetidis, D. Georgiou, A. Laskarakis, Phys. Status Solidi C 5, 1366 (2008)
A. Laskarakis, S. Kassavetis, C. Gravalidis, S. Logothetidis, Nucl. Instrum. Methods Phys. Res. B 268, 460 (2010)
A. Laskarakis, S. Logothetidis, Appl. Surf. Sci. 253, 52 (2006)
G.E. Jellison, F.A. Modine, Appl. Phys. Lett. 69, 371 (1996)
H.F. Dam, F.C. Krebs, Sol. Energy Mater. Sol. Cells 97, 191 (2012)
A. Laskarakis, S. Logothetidis, E. Pavlopoulou, M. Gioti, Thin Solid Films 455–456, 43 (2004)
T. Yoshioka, M. Tsuji, Y. Kawahara, S. Kohjiya, J. Appl. Polym. Sci. 44, 7997 (2003)
L.A.A. Pettersson, S. Ghosh, O. Inganas, Org. Electron. 3, 143 (2002)
F.C. Krebs, Sol. Energy Mater. Sol. Cells 93, 394 (2009)
P.E. Burrows, G.L. Graff, M.E. Gross, P.M. Martin, M.K. Shi, M. Hall, E. Mast, C. Bonham, W. Bennett, M.B. Sullivan, Displays 22, 65 (2001)
C. Charton, N. Schiller, M. Fahland, A. Hollander, A. Wedel, K. Noller, Thin Solid Films 502, 99 (2006)
K. Haas, S. Amberg-Schwab, K. Rose, Thin Solid Films 351, 198 (1999)
J. Fahlteich, M. Fahland, W. Schönberger, N. Schiller, Thin Solid Films 517, 3075 (2009)
B.M. Hanika, H. Langowski, U. Moosheimer, W. Peukert, Chem. Eng. Technol. 26, 605 (2003)
K. Haas, K. Rose, Rev. Adv. Mater. Sci. 5, 47 (2003)
D. Georgiou, S. Logothetidis, C. Koidis, A. Laskarakis, Phys. Status Solidi C 5, 1300 (2008)
D.G. Howells, B.M. Henry, J. Madocks, H.E. Assender, Thin Solid Films 516, 3081 (2008)
A.P. Roberts, B.M. Henry, A.P. Sutton, C.R.M. Grovenor, G.A.D. Briggs, T. Miyamoto, M. Kano, Y. Tsukahara, M. Yanaka, J. Membr. Sci. 208, 75 (2002)
A.S. da Silva Sobrinho, M. Latreche, G. Czeremuszkin, J.E. Klemberg-Sapieha, M.R. Wertheimer, J. Vac. Sci. Technol. A 16(6), 3190 (1998)
M. Yanaka, B.M. Henry, A.P. Roberts, C.R.M. Grovenor, G.A.D. Briggs, A.P. Sutton, Thin Solid Films 397, 176 (2001)
D. Georgiou, A. Laskarakis, C. Koidis, N. Goktsis, S. Logothetidis, Phys. Status Solidi C 5, 3387 (2008)
Y. Chen, K.S. Kang, K.J. Han, K.H. Yoo, J. Kim, Synth. Met. 159, 1701 (2009)
A.M. Nardes, R.A.J. Janssen, M. Kemerink, Adv. Funct. Mater. 18, 865 (2008)
Z. Xiong, C. Liu, Org. Electron. 13, 1532 (2012)
A. Nardes, M. Kemerink, R. Janssen, Phys. Rev. B 76, 1 (2007)
G. Wang, S.-I. Na, T.-W. Kim, Y. Kim, S. Park, T. Lee, Org. Electron. 13, 771 (2012)
T.P. Nguyen, P. Le Rendu, P.D. Long, S.A. De Vos, Surf. Coat. Technol. 180–181, 646 (2004)
O.P. Dimitriev, D.A. Grinko, Y.V. Noskov, N.A. Ogurtsov, A.A. Pud, Synth. Met. 159, 2237 (2009)
C.J. Brabec, Sol. Energy Mater. Sol. Cells 83, 273 (2004)
H. Hoppe, N.S. Sariciftci, J. Mater. Res. 19, 1924 (2011)
A. Onorato, M.A. Invernale, I.D. Berghorn, C. Pavlik, G.A. Sotzing, M.B. Smith, Synth. Met. 160, 2284 (2010)
S.-I. Na, G. Wang, S.-S. Kim, T.-W. Kim, S.-H. Oh, B.-K. Yu, T. Lee, D.-Y. Kim, J. Mater. Chem. 19, 9045 (2009)
N.G. Semaltianos, S. Logothetidis, N. Hastas, W. Perrie, S. Romani, R.J. Potter, G. Dearden, K.G. Watkins, P. French, M. Sharp, Chem. Phys. Lett. 484, 283 (2010)
A. Nardes, M. Kemerink, M. Dekok, E. Vinken, K. Maturova, R. Janssen, Org. Electron. 9, 727 (2008)
S. Jonsson, J. Birgerson, X. Crispin, G. Greczynski, W. Osikowicz, A.W.D. van der Gon, W.R. Salaneck, M. Fahlman, Synth. Met. 139, 1 (2003)
H. Yan, H. Okuzaki, Synth. Met. 159, 2225 (2009)
M. Fabretto, C. Hall, T. Vaithianathan, P.C. Innis, J. Mazurkiewicz, G.G. Wallace, P. Murphy, Thin Solid Films 516, 7828 (2008)
A. Laskarakis, P.G. Karagiannidis, D. Georgiou, D.M. Nikolaidou, S. Logothetidis, Thin Solid Films (2013). doi:10.1016/j.tsf.2013.03.138
B. Friedel, P.E. Keivanidis, T.J.K. Brenner, A. Abrusci, C.R. McNeill, R.H. Friend, N.C. Greenham, Macromolecules 42, 6741 (2009)
Y.H. Kim, C. Sachse, M.L. Machala, C. May, L. Müller-Meskamp, K. Leo, Adv. Funct. Mater. 21, 1076 (2011)
S.-I. Na, S.-S. Kim, J. Jo, D.-Y. Kim, Adv. Mater. 20, 4061 (2008)
M.V. Madsen, K.O. Sylvester-hvid, B. Dastmalchi, K. Hingerl, K. Norrman, T. Tromholt, M. Manceau, D. Angmo, F.C. Krebs, J. Phys. Chem. C 115, 10817 (2011)
L.A.A. Pettersson, T. Johansson, F. Carlsson, H. Arwin, O. Inganäs, Synth. Met. 101, 198 (1999)
K. Yim, R. Friend, J. Kim, J. Chem. Phys. 124, 184706 (2006)
S. Logothetidis, A. Laskarakis, Eur. Phys. J. Appl. Phys. 46, 12502 (2009)
D. Georgiou, A. Laskarakis, S. Logothetidis, S. Amberg-Schwab, U. Weber, M. Schmidt, K. Noller, Appl. Surf. Sci. 255, 8023 (2009)
A. Laskarakis, S. Logothetidis, D. Georgiou, S. Amberg-Schwab, U. Weber, Thin Solid Films 517, 6275 (2009)
Y. Leterrier, Prog. Mater. Sci. 48, 1 (2003)
N. Koch, ChemPhysChem 8, 1438 (2007)
P.G. Karagiannidis, N. Kalfagiannis, D. Georgiou, A. Laskarakis, N.A. Hastas, C. Pitsalidis, S. Logothetidis, J. Mater. Chem. 22, 14624 (2012)
P.G. Karagiannidis, D. Georgiou, C. Pitsalidis, A. Laskarakis, S. Logothetidis, Mater. Chem. Phys. 129, 1207 (2011)
M.M. Voigt, R.C.I. Mackenzie, C.P. Yau, P. Atienzar, J. Dane, P.E. Keivanidis, D.D.C. Bradley, J. Nelson, Sol. Energy Mater. Sol. Cells 95, 731 (2011)
D.C. Harris, M.D. Bertolucci, Symmetry and Spectroscopy (Oxford University Press, New York, 1978)
Acknowledgements
The authors would like to thank Dr. Nikolaos Kalfagiannis, Dr. Despoina Georgiou, Dr. Christos Koidis, Dr. Panagiotis G. Karagiannidis and the other staff of the Lab for Thin Films, Nanosystems and Nanometrology (LTFN) for their contribution. The authors would also like to thank Amcor for supply of the SiO x /PET rolls, Clevios for the supply of the PEDOT:PSS formulations and Fraunhofer-Institut für Silicatforschung for the supply of the hybrid polymer formulations. This work was partially supported by the EC STREP Project OLAtronics, Grand Agreement No. 216211, and by the EC REGPOT Project ROleMak No. 286022.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Laskarakis, A., Logothetidis, S. (2014). In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates. In: Hinrichs, K., Eichhorn, KJ. (eds) Ellipsometry of Functional Organic Surfaces and Films. Springer Series in Surface Sciences, vol 52. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40128-2_13
Download citation
DOI: https://doi.org/10.1007/978-3-642-40128-2_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-40127-5
Online ISBN: 978-3-642-40128-2
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)