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Ellipsometry of Functional Organic Surfaces and Films pp 265–286Cite as

In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 52))

Abstract

A major factor for the achievement of the required performance, efficiency and lifetime of organic electronic (OE) devices (Organic Photovoltaics—OPVs, Organic Light Emitting Diodes—OLEDs, etc.) is the quality control of the substrates, active layers, barrier materials and transparent electrode nanolayers that are used for the fabrication of these devices. The in-line optical characterization and modeling of the optical and electrical properties of the above nanolayers can give valuable information of the growth mechanisms and the structure-property relationships that can play a major role towards the optimization of the nanolayers performance. Also, the capability for in-line monitoring, at every single step, of the optical properties and the quality of the fabricated nanolayers, e.g. by roll-to-roll (r2r) process, will improve the process yield opening the way for the low cost fabrication of OE devices.

In this chapter, we will discuss in detail the latest advances on the combination of optical sensing by Spectroscopic Ellipsometry with the processes (vacuum deposition, r2r printing) for fabrication of OE nanolayers and devices. These advances include the results of the determination of the optical constants, composition, refractive index, thickness with nm precision, stability and the uniformity of the OE nanolayers onto rigid (e.g. c-Si, glass) and flexible (as Polyethylene Terephthalate—PET) substrates.

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Acknowledgements

The authors would like to thank Dr. Nikolaos Kalfagiannis, Dr. Despoina Georgiou, Dr. Christos Koidis, Dr. Panagiotis G. Karagiannidis and the other staff of the Lab for Thin Films, Nanosystems and Nanometrology (LTFN) for their contribution. The authors would also like to thank Amcor for supply of the SiO x /PET rolls, Clevios for the supply of the PEDOT:PSS formulations and Fraunhofer-Institut für Silicatforschung for the supply of the hybrid polymer formulations. This work was partially supported by the EC STREP Project OLAtronics, Grand Agreement No. 216211, and by the EC REGPOT Project ROleMak No. 286022.

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Authors and Affiliations

  1. Lab for Thin Films-Nanosystems & Nanometrology (LTFN), Department of Physics, Aristotle University of Thessaloniki, 54124, Thessaloniki, Greece

    Agiris Laskarakis & Stergios Logothetidis

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  1. Agiris Laskarakis
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  2. Stergios Logothetidis
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Correspondence to Agiris Laskarakis .

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  1. Leibniz Institute for Analytical Sciences - ISAS - e. V., Berlin, Germany

    Karsten Hinrichs

  2. Leibniz Institute of Polymer Research Analytics, Dresden, Germany

    Klaus-Jochen Eichhorn

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Laskarakis, A., Logothetidis, S. (2014). In-line Quality Control of Organic Thin Film Fabrication on Rigid and Flexible Substrates. In: Hinrichs, K., Eichhorn, KJ. (eds) Ellipsometry of Functional Organic Surfaces and Films. Springer Series in Surface Sciences, vol 52. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40128-2_13

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