Abstract
In order to adaptably monitor product qualities during real industrial process, a new multivariate statistical process monitoring scheme combining projection to latent spaces (PLS) and Support Vector Domain Description (SVDD) is proposed. PLS can establish the monitoring space, which maximizes the correlation between process variables and quality variables and enable product qualities monitoring through process variables. SVDD can define the admissible domain by normal operation data without constraints about data distribution. Moreover, with kernel functions it can even provide a tight admissible domain for the operation data. Such characteristics make it suitable for practical production processes. This scheme is then applied to Tennessee Eastman process, and its efficiency for fault detection is proved by introducing simulated process faults. Analysis about its limits in fault detection is also presented.
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Acknowledgment
This work is supported by National Key Basic Research Program (973 Program) of China under Grant 2012CB724304.
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Liu, J., Sun, Yg. (2013). Multivariate Statistical Process Monitoring Scheme with PLS and SVDD. In: Qi, E., Shen, J., Dou, R. (eds) Proceedings of 20th International Conference on Industrial Engineering and Engineering Management. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40072-8_6
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DOI: https://doi.org/10.1007/978-3-642-40072-8_6
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