Abstract
This chapter aims to describe some of the design challenges and emerging trends for high-speed and high-resolution digital-to-analog converters (DACs). We present an overview of the digital-to-analog conversion process and delve into DAC characterization by outlining different sources of error and metrics used to quantify the DAC performance. A summary of current-steering (CS) DAC topologies and circuit limitations is provided, and we details four major considerations in the design space of CS DACs providing a supplemental approach to segmentation. Finally an in-depth survey of current and emerging architectural trends in high-performance DACs is discussed.
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Notes
- 1.
Code-dependency is equivalently mentioned as signal dependency, where signal refers to the desired output waveform.
- 2.
Care should be taken in choosing appropriate FFT resolution bandwidth (or bin spacing) to set the minimum detectable power level.
- 3.
\( b_{i} \) takes discrete values of 0 or 1 and referred in little-endian format.
- 4.
\( t_{i} \) takes discrete values of 0 or 1 and referred in little-endian format.
- 5.
Some books also use the term ‘arm’ as an equivalent to ‘leg’.
- 6.
The flicker noise has been removed in the simulation.
- 7.
The noise contribution of the DAC core is assumed negligible compared to the bias noise.
- 8.
This will be described later in detail in Sect. 3.6.
- 9.
Gate capacitances need to be relatively larger than the gate-drain capacitances of \( M_{1} \) and \( M_{2} \).
- 10.
Switching refers to the action of turning a transistor from cut-off to saturation or vice versa.
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Balasubramanian, S., Patel, V.J., Khalil, W. (2014). Current and Emerging Trends in the Design of Digital-to-Analog Converters. In: Carbone, P., Kiaei, S., Xu, F. (eds) Design, Modeling and Testing of Data Converters. Signals and Communication Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-39655-7_3
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