Abstract
This paper characterizes how compiler optimizations impact software control-flow reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation induced soft-errors occurring in branches. Supported by a comprehensive fault injection campaign using an established benchmark suite in the embedded systems domain, we show that the careful selection of the available compiler optimizations is necessary to avoid a significant decrease of software reliability while sustaining the performance boost those optimizations provide.
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Parizi, R.B., Ferreira, R.R., Carro, L., Moreira, Á.F. (2013). Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software. In: Schirner, G., Götz, M., Rettberg, A., Zanella, M.C., Rammig, F.J. (eds) Embedded Systems: Design, Analysis and Verification. IESS 2013. IFIP Advances in Information and Communication Technology, vol 403. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38853-8_5
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DOI: https://doi.org/10.1007/978-3-642-38853-8_5
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