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X-Ray Diffraction in Ideal Crystals

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Theoretical Concepts of X-Ray Nanoscale Analysis

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 183))

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Abstract

The reflection phenomena, discussed in the previous chapter, are inherent for radiation of arbitrary wavelength.

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Authors and Affiliations

  1. Physics Department, Belarusian State University, Nezavisimosti Av. 4, 200030, Minsk, Belarus

    Andrei Benediktovitch & Ilya Feranchuk

  2. Rigaku Europe SE, Am Hardtwald 11, 76275, Ettlingen, Germany

    Alexander Ulyanenkov

Authors
  1. Andrei Benediktovitch
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  2. Ilya Feranchuk
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  3. Alexander Ulyanenkov
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Correspondence to Andrei Benediktovitch .

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Benediktovitch, A., Feranchuk, I., Ulyanenkov, A. (2014). X-Ray Diffraction in Ideal Crystals. In: Theoretical Concepts of X-Ray Nanoscale Analysis. Springer Series in Materials Science, vol 183. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38177-5_4

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  • DOI: https://doi.org/10.1007/978-3-642-38177-5_4

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