Skip to main content
SpringerLink
Log in

X-Ray Reflectivity

  • Chapter
  • First Online:
Theoretical Concepts of X-Ray Nanoscale Analysis

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 183))

  • 1820 Accesses

Abstract

The general calculation of the scattered from the sample X-ray intensity requires the solution of the Eq. (2.1). However, the geometry of the experiment has to be also taken into account, because of the mutual arrangement of the X-ray source, the sample and the detector as well as the shape of the sample influence the observed results.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 119.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD 159.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. E. Prince (ed.), International Tables for Crystallography vol. C (Kluwer Academic Publishers, Dordrecht/Boston/Lomdon, 2004)

    Google Scholar 

  2. M. Born, E. Wolf, Principles of Optics, 7th edn. (Cambridge University Press, UK, 1999)

    Google Scholar 

  3. B.L. Henke, E.M. Gullikson, J.C. Davis, At. Data Nucl. Data Tables 54, 181 (1993)

    Article  ADS  Google Scholar 

  4. J. Daillant, A. Gibaud, X-Ray and Neutron Reflectivity: Principles and Applications (Springer-Verlag, Berlin Heidelberg, 1999)

    Google Scholar 

  5. M. Tolan, X-Ray Scattering from Soft-Matter Thin Films (Springer-Verlag, Berlin Heidelberg, 1999)

    Google Scholar 

  6. J. Als-Nielsen, D. McMorrow, Elements of Modern X-Ray Physics (Wiley, New York, 2001)

    Google Scholar 

  7. U. Pietsch, V. Holy, T. Baumbach, High-Resolution X-Ray Scattering: from Thin Films to Lateral Nanostuctures, 2nd edn. (Springer-Verlag, Berlin Heidelberg, 2004)

    Google Scholar 

  8. D.K.G. de Boer, Phys. Rev. B 49, 5817 (1994)

    Google Scholar 

  9. D.K.G. de Boer, Phys. Rev. B 51, 5297 (1995)

    Google Scholar 

  10. D.K.G. de Boer, Phys. Rev. B 53, 6048 (1996)

    Google Scholar 

  11. S. Dietrich, A. Haase, Phys. Rep. 260, 1 (1995)

    Article  ADS  Google Scholar 

  12. A. Caticha, Phys. Rev. B 52, 9214 (1995)

    Article  ADS  Google Scholar 

  13. I.D. Feranchuk, S.I. Feranchuk, L.I. Komarov, A. Ulyanenkov, Phys. Rev. B 67, 235417 (2003)

    Article  ADS  Google Scholar 

  14. I.D. Feranchuk, S.I. Feranchuk, A.A. Minkevich, A.P. Ulyanenkov, Phys. Rev. B. 68, 235307 (2003)

    Google Scholar 

  15. I. Feranchuk, A. Ulyanenkov, European Patent EP1469302 A 1, (2004)

    Google Scholar 

  16. I.D. Feranchuk, S.I. Feranchuk, A.P. Ulyanenkov, Phys. Rev. B. 75, 085414 (2007)

    Google Scholar 

  17. L.D. Landau, E.M. Lifshitz, Electrodynamics of Condensed Matter, 2nd edn. (Nauka, Moscow, 1982)  (in russian)

    Google Scholar 

  18. P.M. Mors, H. Feshbach, Methods of Theoretical Physics, vol. 1 (Springer-Verlag, Berlin, 1987)

    Google Scholar 

  19. V.K. Ignatovich, Neutron Optics (Fizmatlit, Moscow, 2006) (in russian)

    Google Scholar 

  20. L. Hörmander, The Analysis of Linear Partial Differential Operators (Springer-Verlag, Berlin Heidelberg, 1983)

    Google Scholar 

  21. L.D. Landau, E.M. Lifshitz Quantum Mechanics, 3rd edn. (Pergamon Press, Oxford, 1977)

    Google Scholar 

  22. S.K. Sinha, E.B. Sirota, S. Garoff, H.B. Stanley, Phys. Rev. B 38, 2297 (1988)

    Article  ADS  Google Scholar 

  23. L. Nevot, P. Croce, Rev. Phys. Appl. 15, 761 (1980)

    Article  Google Scholar 

  24. I.D. Feranchuk, A.A. Minkevich, A.P. Ulyanenkov, Eur. Phys. J. Appl. Phys. 24, 21 (2003)

    Article  ADS  Google Scholar 

  25. J. Als-Nielsen, D. Jacquemann, K. Kjaer, F. Leveiller, M. Lahav, L. Leseirowitz, Phys. Rep. 246, 251 (1994)

    Article  ADS  Google Scholar 

  26. I.D. Feranchuk, L.I. Komarov, I.V. Nichipor, A.P. Ulyanenkov, Ann. Phys. NY 238, 370 (1995)

    Google Scholar 

  27. P.S. Epstein, Proc. Natl. Acad. Sci. USA 16, 67 (1930)

    ADS  Google Scholar 

  28. P. Walters, An Introduction to Ergodic Theory (Springer, New York, 1982)

    Google Scholar 

  29. V. Holý, C. Giannini, L. Tapfer, T. Marschner, W. Stolz, Phys. Rev. B 55, 9960 (1997)

    Article  ADS  Google Scholar 

  30. L.G. Parratt, Phys. Rev. 95, 359 (1954)

    Article  ADS  Google Scholar 

  31. L. Abeles, Ann. Phys (Paris) 3, 504 (1948)

    Google Scholar 

  32. L. Abeles, Ann. Phys (Paris) 5, 596 (1950)

    Google Scholar 

  33. D.W. Berremen, Phys. Rev. B 14, 4313 (1976)

    Google Scholar 

  34. S.A. Stepanov, R.Köhler, J. Phys. D 27, 1923 (1994)

    Google Scholar 

  35. J.M. Ziman, Principles of The Theory of Solids (Oxford Univ. Press, New York, 2001)

    Google Scholar 

  36. A.P. Payne, B.M. Clemens, Phys. Rev. B 47, 2289 (1993)

    Article  ADS  Google Scholar 

  37. T.-Y. Wu, T. Omura, Quantum Theory of Scattering (Prentice-Hall Inc., New York, 1962)

    MATH  Google Scholar 

  38. R.W. James, The Optical Principle of the Diffraction of X-rays (G.Bell and Sons, London, 1962)

    Google Scholar 

  39. V. Holy, T. Baumbach, Phys. Rev. B 49, 10668 (1994)

    Article  ADS  Google Scholar 

  40. D.E. Goldberg, E. David, Genetic Algorithms in Search Optimization and Machine Learning (Addison-Wesley Reading, MA, 1989)

    Google Scholar 

  41. A. Ulyanenkov, K. Omote, J. Harada, Physica B 283, 237 (2000)

    Article  ADS  Google Scholar 

  42. A. Ulyanenkov, S. Sobolewski, J. Phys.D: Appl. Phys. 38, A235 (2005)

    Google Scholar 

  43. A. Ulyanenkov, A. Takase, M. Kuribayashi, K. Ishida, A. Ohtake, K. Arai, T. Hanada, T. Yasuda, H. Tomita, S. Komiya, J. Appl. Phys. 85, 1520 (1999)

    Article  ADS  Google Scholar 

  44. A. Ulyanenkov, R. Matsuo, K. Omote, K. Inaba, J. Harada, M. Ishino, M. Nishii, O. Yoda, J. Appl. Phys. 87, 7255 (2000)

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Physics Department, Belarusian State University, Nezavisimosti Av. 4, 200030, Minsk, Belarus

    Andrei Benediktovitch & Ilya Feranchuk

  2. Rigaku Europe SE, Am Hardtwald 11, 76275, Ettlingen, Germany

    Alexander Ulyanenkov

Authors
  1. Andrei Benediktovitch
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Ilya Feranchuk
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Alexander Ulyanenkov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Andrei Benediktovitch .

Rights and permissions

Reprints and permissions

Copyright information

© 2014 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Benediktovitch, A., Feranchuk, I., Ulyanenkov, A. (2014). X-Ray Reflectivity. In: Theoretical Concepts of X-Ray Nanoscale Analysis. Springer Series in Materials Science, vol 183. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38177-5_3

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-38177-5_3

  • Published:

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-38176-8

  • Online ISBN: 978-3-642-38177-5

  • eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)

Publish with us

Policies and ethics

Search

Navigation