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Prediction of Adhesion Strength for IC Plastic Package Under Humid Conditions—Fracture Mechanics Approach

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Design of Adhesive Joints Under Humid Conditions

Part of the book series: Advanced Structured Materials ((STRUCTMAT,volume 25))

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Abstract

We introduce a new adhesion test method for IC molding compounds that can experimentally separate residual stress from adhesion strength. This chapter describes the dependence of the measured true adhesion strength of molding compounds on adherent materials, temperature, and moisture absorption. We also evaluate interface delamination in a moisture-absorbed package by considering the swelling of the molding compound caused by moisture absorption. The predicted interface delamination agrees well with experimental data for moisture-soaked IC packages.

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References

  1. Furusawa, I., Ishiguro, S., Nanbu, S.: Moisture resistance degradation of plastic LSIs by reflow soldering. In: Proceeding, 23th international reliability physics symposium, pp. 192–197 (1985)

    Google Scholar 

  2. Kitano, M., Nishimura, A., Kawai, R., Nishi, K.: Analysis of package cracking during reflow soldering process. In: Proceeding, 26th international reliability physics symposium, pp. 90–95 (1988)

    Google Scholar 

  3. Kitano, M., Nishimura, A., Kouno, R.: Development of damage detection system for surface mount package during reflow soldering. In: Proceeding, 41st electronic components and technology conference, pp. 615–620 (1991)

    Google Scholar 

  4. Bair, H.E., Boyle, D.J., Ryan, J.T., Taylor, C.R., Tighe, S.C., Crouthamel, D.L.: Thermomechanical properties of IC molding compounds. Polym. Eng. Sci. 30, 90–95 (1990)

    Article  Google Scholar 

  5. Nishimura, A., Tatemichi, A., Miura, H., Sakamoto, T.: Life estimation for IC plastic package under temperature cycling based on fracture mechanics. IEEE Trans. Compon. Hybrids Manuf. Technol. CPMT-10, 673–642 (1987)

    Google Scholar 

  6. Nishimura, A., Kawai, S., Murakami, G.: Effect of lead frame material on plastic-encapsulated IC Package cracking under temeperature cycling. IEEE Trans. Compon. Hybrids Manuf. Technol. 12, 639–645 (1989)

    Article  Google Scholar 

  7. Kim, S.: The role of plastic package adhesion in performance. IEEE Trans. Compon. Hybrids Manuf. Technol. 14, 809–817 (1991)

    Article  Google Scholar 

  8. Yoshioka, O., Okabe, N., Yamagishi, R., Nagayama, S., Murakami, G.: Improvement of moisture resistance in plastic encapsulation MOS-IC by surface finishing copper leadframe. In: Proceeding, 39th electronic components and technology conference, pp. 464–471 (1989)

    Google Scholar 

  9. Malyshev, B., Salganik, R.L.: The strength of adhesive joints using the theory of cracks. Int. J. Fract. Mech. 1, 114–128 (1965)

    CAS  Google Scholar 

  10. Kinloch, A.J.: The science of adhesion, part 2 mechanics and mechanism of failure. J. Mater. Sci. 17, 617–651 (1982)

    Article  CAS  Google Scholar 

  11. Hattori, T., Sakata, S., Murakami, G.: A stress singularity parameter approach for evaluating the interfacial reliability of plastic encapsulated LSI devices. ASME J. Electron. Packag. 111, 243–248 (1989)

    Article  Google Scholar 

  12. Nishimura, A., Hirose, I., Tanaka, N.: A new method for measuring adhesion strength of IC molding compounds. ASME J. Electron. Packag. 114, 407–412 (1992)

    Article  Google Scholar 

  13. Tanaka, N., Nishimura, A.: Measurement of IC molding compound adhesion strength and prediction of interface delamination within package. ASME Adv. Electron. Packag. EEP-Vol. 10.2, 765–773 (1995)

    Google Scholar 

  14. Tanaka, N., Kitano, M., Kumazawa, T., Nishimura, A.: Evaluating IC-package interface delamination by considering moisture-induced molding-compound swelling. IEEE Trans. Compon. Packag. Technol. 22(3):426–432 (1999)

    Google Scholar 

  15. Sawyer, S.G., Anderson, R.B.: Collocated interfacial stress intensity factors for finite Bi-material plates. Eng. Fract. Mech. 4, 605–616 (1972)

    Article  Google Scholar 

  16. Yuuki, R., Cho, S.B.: Efficient boundary element analysis of stress intensity factor for interface crack in dissimilar materials. Eng. Fract. Mech. 34, 179–188 (1989)

    Article  Google Scholar 

  17. Ogata, M., Kinjo, N., Kawata, T.: Effects of crosslinking on physical properties of phenol-formaldehyde Novolac cured epoxy resins. J. Appl. Polym. Sci. 48, 583–601 (1993)

    Article  CAS  Google Scholar 

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Correspondence to Naotaka Tanaka .

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Tanaka, N. (2013). Prediction of Adhesion Strength for IC Plastic Package Under Humid Conditions—Fracture Mechanics Approach. In: da Silva, L., Sato, C. (eds) Design of Adhesive Joints Under Humid Conditions. Advanced Structured Materials, vol 25. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-37614-6_6

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