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High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems

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Photoelectron Spectroscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 176))

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Abstract

As discussed in Chap. 4 and 5, the bulk sensitivity becomes essential in photoelectron spectroscopy when one studies the electronic structure of strongly correlated electron systems where the effect of the short range Coulomb repulsion U becomes decisive.

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  1. Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan

    Shigemasa Suga

  2. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka, 560-8531, Japan

    Akira Sekiyama

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Suga, S., Sekiyama, A. (2014). High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems. In: Photoelectron Spectroscopy. Springer Series in Optical Sciences, vol 176. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-37530-9_7

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