Abstract
Existing work in the field of Multiple Instance Learning (MIL) have only looked at the standard two-class problem assuming both positive and negative bags are available. In this work, we propose the first analysis of the one-class version of MIL problem where one is only provided input data in the form of positive bags. We also propose an SVM-based formulation to solve this problem setting. To make the approach computationally tractable we further develop a iterative heuristic algorithm using instance priors. We demonstrate the validity of our approach with synthetic data and compare it with the two-class approach. While previous work in target tracking using MIL have made certain run-time assumptions (such as motion) to address the problem, we generalize the approach and demonstrate the applicability of our work to this problem domain. We develop a scene prior modeling technique to obtain foreground-background priors to aid our one-class MIL algorithm and demonstrate its performance on standard tracking sequences.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Chen, Y., Bi, J., Wang, J.: Miles: Multiple instance learning via embedded instance selection. IEEE TPAMI (2006)
Babenko, B., Yang, M., Belongie, S.: Visual tracking with online multiple instance learning. In: Proc. IEEE CVPR (2009)
Sankaranarayanan, K., Davis, J.: Object association across ptz cameras using logistic mil. In: Proc. IEEE CVPR (2011)
Scholkopf, B., Platt, J.C., Shawe-Taylor, J., Smola, A.J., Williamson, R.C.: Estimating the support of a high-dimensional distribution. Neural Computation 13, 2001 (1999)
Dietterich, T., Lozano-Perez, T.: Solving the multiple-instance problem with axis-parallel rectangles. In: Artificial Intelligence (1997)
Maron, O., Lozano-Perez, T.: A framework for multiple instance learning. In: Proc. Neural Information Processing Systems, NIPS (1998)
Andrews, S., Hofmann, T.: Support vector machines for multiple instance learning. In: Proc. Neural Information Processing Systems, NIPS (2003)
Fu, Z., Robles-Kelly, A., Zhou, J.: Milis: Multiple instance learning with instance selection. In: IEEE TPAMI, pp. 958–977 (2011)
Mu, L., Kwok, J., Bao-Liang, L.: Online multiple instance learning with no regret. In: Proc. IEEE CVPR (2010)
Viola, P., Platt, J., Zhang, C.: Multiple instance boosting for object detection. In: Proc. Neural Information Processing Systems, NIPS (2005)
Ester, M., Kriegel, H., Xu, X.: A density-based algorithm for discovering clusters in large spatial databases with noise. In: ACM Conference on Knowledge Discovery in Databases SIGKDD (1996)
Tax, D.M.J., Duin., R.P.W.: Outliers and data descriptions. In: Proceedings of the 7th Annual Conference of the Advanced School for Computing and Imaging (2001)
Crammer, K., Chechik, G.: A needle in a haystack: local one-class optimization. In: Proc. ICML (2004)
Gupta, G., Ghosh., J.: Robust one-class clustering using hybrid global and local search. In: Proc. ICML (2005)
Crammer, K., Talukdar, P., Pereira, F.: A rate-distortion one-class model and its applications to clustering. In: Proc. ICML (2008)
Malik, J., Belongie, S., Leung, T., Shi, J.: Contour and texture analysis for image segmentation. International Journal of Computer Vision (IJCV), 7–27 (2001)
Schwarz, G.: Estimating the dimension of a model. Annals of Statistics, 461–464 (1978)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Sankaranarayanan, K., Davis, J.W. (2013). One-Class Multiple Instance Learning and Applications to Target Tracking. In: Lee, K.M., Matsushita, Y., Rehg, J.M., Hu, Z. (eds) Computer Vision – ACCV 2012. ACCV 2012. Lecture Notes in Computer Science, vol 7726. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-37431-9_10
Download citation
DOI: https://doi.org/10.1007/978-3-642-37431-9_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-37430-2
Online ISBN: 978-3-642-37431-9
eBook Packages: Computer ScienceComputer Science (R0)