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A Simulation-Based Analysis of Cluster Tools Scheduling with Plant Simulation

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The 19th International Conference on Industrial Engineering and Engineering Management
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Abstract

Cluster tools are configurable and integrated equipment. They are widely used in semiconductor fabrication in recent years. It is difficult to effectively operate a cluster tools and schedule it due to wafer residency time constraints and activity time variation of cluster tools. The schedule effects on the time performance of cluster tools operation. In this paper, a simulation model based on Plant simulation is presented to discuss the schedule of cluster tools in steady state. This simulation model could describe and simulate the activities of robot, wafer processing and their corresponding timing of cluster tools operation. Hence, it is a useful method to analyze the time performance of cluster tools such as scheduling. Two examples are used to test the simulation model and show the proposed application of the simulation model.

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References

  • Artherton RF, Turner FT, Pool MA (1990) Performance analysis of multi-process semiconductor manufacturing equipment. In: Proceedings of IEEE/SEMI advanced semiconductor conference, Danvers, MA, 1990, pp 131–136

    Google Scholar 

  • Bader M, Hall R, Strasser G (1990) Integrated processing equipment. Solid State Technol 33(5):149–154

    Google Scholar 

  • Burggraaf P (1995) Coping with the high cost of wafer fabs. IEEE Trans Semiconduct Int 18(38):45–50

    Google Scholar 

  • Kim J-H, Lee T-E, Lee H-Y, Park D-B (2003) Scheduling analysis of timed-constrained dual-armed cluster tools. IEEE Trans Semiconduct Manuf 16(3):521–534

    Article  Google Scholar 

  • Koehler EJ, Seppanen MS (1999) Evaluation of cluster tool throughput for thin film head production. In: Proceedings of 1999 winter simulation conference, Phoenix, 1999, pp 714–719

    Google Scholar 

  • Lee T-E (2008) A review of scheduling theory and methods for semiconductor manufacturing cluster tools. In: Proceedings of 2008 winter simulation conference, Miami, 2008, pp 2127–2135

    Google Scholar 

  • Lee T-E, Park S-H (2005) An extended event graph with negative places and tokens for timed window constraints. IEEE Trans Automat Sci Eng 2(4):319–332

    Article  Google Scholar 

  • Li F, Wu N-q (2009) Virtual cluster tool in wafer fabrication based on eM-Plant. Comput Eng 35(10):232–234 (in Chinese)

    Google Scholar 

  • Lopez MJ, Wood SC (1998) Systems of multiple cluster tools: configuration and performance under perfect reliability. IEEE Trans Semiconduct Manuf 11(3):465–474

    Article  Google Scholar 

  • Lopez MJ, Wood SC (2003) Systems of multiple cluster tools: configuration, reliability, and performance. IEEE Trans Semiconduct Manuf 16(2):170–178

    Article  Google Scholar 

  • McNab TK (1990) Cluster tools, part 1: emerging processes. IEEE Trans Semiconduct Int 13(9):58–63

    Google Scholar 

  • Newboe B (1990) Cluster tools: a process solution. IEEE Trans Semiconduct Int 13(8):82–88

    Google Scholar 

  • Pan C-r, Wu N-q (2009) Modeling and simulation of single-arm cluster tool in wafer fabrication. J Syst Simul 21(2):554–562 (in Chinese)

    Google Scholar 

  • Perkinson TL, MacLarty PK, Gyurcsik RS, Cavin RK III (1994) Single-wafer cluster tool performance: an analysis of throughput. IEEE Trans Semiconduct Manuf 7(3):369–373

    Article  Google Scholar 

  • Perkinson TL, Gyurcsik RS, MacLarty PK (1996) Single-wafer cluster tool performance: an analysis of the effects of redundant chambers and revisitations sequences on throughput. IEEE Trans Semiconduct Manuf 9:384–400

    Article  Google Scholar 

  • Singer P (1995) The driving forces in cluster tool development. Semiconduct Int 18(8):113–118

    Google Scholar 

  • Srinivasn RS (1998) Modeling and performance analysis of cluster tools using Petri nets. IEEE Trans Semiconduct Manuf 11(3):394–403

    Article  Google Scholar 

  • Wu NQ (1999) Necessary and sufficient conditions for deadlock-free operation in flexible manufacturing systems using a colored Petri net model. IEEE Trans Syst Man Cybern Part C 29(2):192–204

    Article  Google Scholar 

  • Wu NQ, Zhou MC (2001) Avoiding deadlock and reducing starvation and blocking in automated manufacturing systems based on a Petri net model. IEEE Trans Robot Automat 17(5):658–669

    Article  Google Scholar 

  • Wu NQ, Zhou MC (2010a) Colored timed petri nets for modeling and analysis of cluster tools. Asian J Contr 12(3):253–266

    Article  Google Scholar 

  • Wu NQ, Zhou MC (2010b) A closed-form solution for schedulability and optimal scheduling of dual-arm cluster tools with wafer residency time constraint based on steady schedule analysis. IEEE Trans Automat Sci Eng 7(2):303–315

    Article  Google Scholar 

  • Wu NQ, Zhou MC (2010c) Analysis of wafer sojourn time in dual-arm cluster tools with residency time constraint and activity time variation. IEEE Trans Semiconduct Manuf 23(1):53–64

    Article  Google Scholar 

  • Wu NQ, Zhou MC (2010d) Petri net-based scheduling of time-constrained dual-arm cluster tools with bounded activity time variation. In: Proceedings of 6th IEEE conference on automation science and engineering, Toronto, 21–24 Aug 2010, pp 465–470

    Google Scholar 

  • Wu N, Chu C, Chu F, Zhou M (2008) A Petri net method for schedulability and scheduling problem in single-arm cluster tools with wafer residency time constraint. IEEE Trans Semiconduct Manuf 21(2):224–237

    Article  Google Scholar 

  • Wu NQ, Chu F, Chu CB, Zhou MC (2011a) Petri net-based scheduling of single-arm cluster tools with reentrant atomic layer deposition processes. IEEE Trans Automat Sci Eng 8(1):42–55

    Article  Google Scholar 

  • Wu NQ, Chu F, Chu CB, Zhou MC (2011b) Petri net-based cycle time analysis of dual-arm cluster tools with wafer revisiting and swapping strategy. In: Proceedings of 2011 IEEE international conference on robotics and automation, Shanghai, 2011, pp 5499–5504

    Google Scholar 

  • Zuberek WM (2001) Timed Petri nets in modeling and analysis of cluster tools. IEEE Trans Robot Automat 17(5):562–575

    Article  Google Scholar 

  • Zuberek WM (2004) Cluster tools with chamber revisiting – modeling and analysis using timed Petri nets. IEEE Trans Semiconduct Manuf 17(3):333–344

    Article  Google Scholar 

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Correspondence to Yan Min .

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Min, Y., Lin, Xr. (2013). A Simulation-Based Analysis of Cluster Tools Scheduling with Plant Simulation. In: Qi, E., Shen, J., Dou, R. (eds) The 19th International Conference on Industrial Engineering and Engineering Management. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-37270-4_7

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