Abstract
Carrier mobility influenced by larger defects, such as dislocations, defect clusters; microcrystalline boundaries, external surfaces, metal/semiconductor boundaries, are all discussed quantitatively in this chapter.
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Böer, K.W. (2013). Carrier Mobility Influenced by Larger Defects. In: Handbook of the Physics of Thin-Film Solar Cells. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36748-9_18
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DOI: https://doi.org/10.1007/978-3-642-36748-9_18
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