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Performance of Physical Unclonable Functions with Shift-Register-Based Post-processing

  • Hyunho Kang
  • Yohei Hori
  • Toshihiro Katashita
  • Akashi Satoh
Part of the Communications in Computer and Information Science book series (CCIS, volume 339)

Abstract

Physical unclonable functions (PUFs) are encoded in the unique physical structure of a system, which stems from process variation, and represent a minimalistic yet secure alternative for authentication on integrated circuits. However, the amount of randomness in the PUF output could be a significant limitation. However, by passing the PUF response to a shift register, the randomness of the PUF output could be greatly increased while maintaining reliability. Here we discuss the performance of an arbiter- and ring-oscillator-type PUF with a simple shift register from the viewpoint of biometrics. Experimental results show that authentication with the shifted response data is superior to that with non-shifted data.

Keywords

Physical Unclonable Functions (PUFs) Arbiter PUF Ring Oscillator PUF Shift Register Biometrics 

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References

  1. 1.
    Verbauwhede, I.M.R.: Secure Integrated Circuits and Systems. Springer (2010)Google Scholar
  2. 2.
    Edward Suh, G., Devadas, S.: Physical Unclonable Functions for Device Authentication and Secret Key Generation. In: Design Automation Conference, DAC 2007 (2007)Google Scholar
  3. 3.
    Lee, J., Lim, D., Gassend, B., Suh, G.E., van Dijk, M., Devadas, S.: A Technique to Build a Secret Key in Integrated Circuits for Identification and Authentication Applications. In: Symposium on VLSI Circuits (2004)Google Scholar
  4. 4.
    Maiti, A., Casarona, J., Mchale, L., Schaumont, P.: A Large Scale Characterization of RO–PUF. In: IEEE Workshop on Hardware Oriented Security and Trust, HOST 2010 (2010)Google Scholar
  5. 5.
    Maes, R., Tuyls, P., Verbauwhede, I.M.R.: Intrinsic PUFs from Flip-flops on Reconfigurable Devices. In: 3rd Benelux Workshop on Information and System Security, WISSec 2008 (2008)Google Scholar
  6. 6.
    Dodis, Y., Reyzin, L., Smith, A.: Fuzzy Extractors: How to Generate Strong Keys from Biometrics and Other Noisy Data. In: Cachin, C., Camenisch, J.L. (eds.) EUROCRYPT 2004. LNCS, vol. 3027, pp. 523–540. Springer, Heidelberg (2004)CrossRefGoogle Scholar
  7. 7.
    Daugman, J.G., Williams, G.O.: A proposed standard for biometric decidability. In: Proceedings of CardTech/SecureTech Conference, pp. 223–234 (1996)Google Scholar
  8. 8.
    Satoh, A., Katashita, T., Sakane, H.: Secure implementation of cryptographic modules–Development of a standard evaluation environment for side channel attacks. Synthesiology-English Edition 3(1), 86–95 (2010)CrossRefGoogle Scholar
  9. 9.
    The download site of Side-channel Attack Standard Evaluation BOard support file in AIST (National Institute of Advanced Industrial Science and Technology), http://www.risec.aist.go.jp/project/sasebo/
  10. 10.
    Hori, Y., Katashita, T., Satoh, A., Yoshida, T.: Quantitative and Statistical Performance Evaluation of Arbiter Physical Unclonable Functions on FPGAs. In: International Conference on ReConFigurable Computing and FPGAs, ReConFig 2010 (2010)Google Scholar
  11. 11.
    On-chip Variability data. The secure embedded system group of the ECE Department at Virginia Tech, http://rijndael.ece.vt.edu/variability/download.html
  12. 12.
    The introduction site of Physical Unclonable Function in AIST (Refer to the part of the Biometric approach to quantitative evaluation of PUF performance), http://staff.aist.go.jp/hori.y/en/puf/index.html

Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  • Hyunho Kang
    • 1
  • Yohei Hori
    • 1
  • Toshihiro Katashita
    • 1
  • Akashi Satoh
    • 2
  1. 1.Research Institute for Secure SystemsNational Institute of Advanced Industrial Science and Technology (AIST)TsukubaJapan
  2. 2.Nanoelectronics Research InstituteNational Institute of Advanced Industrial Science and Technology (AIST)TsukubaJapan

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