Abstract
Material classification is an important application in computer vision. The ability to detect the nature of the object surface from image data has a very high potential for applications ranging from low-level inspection to high-level object recognition. The inherent property of materials to partially polarize the reflected light can serve as a tool to classify them.
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References
Klinker, G., Shafer, S., Kanade, T.: Using a color reflection model to separate highlights from object color. In: Proceedings of International Conference on Computer Vision, pp. 145–150 (1987)
Shafer, S.: Using color to separate reflection components. Color Research Applications 10, 210–218 (1985)
Healey, G., Blanz, W.: Identifying metal surfaces in color images. In: Proceedings of Conference in Optics, Electro-Optics, and Sensors (1988)
Healey, G., Binford, T.: Predicting material classes. In: Proceedings of DARPA Image Understanding Workshop, pp. 1140–1146 (1988)
Wolff, L.: Polarization based material classification from specular reflection. IEEE Transactions on Pattern Analysis and Machine Intelligence 12, 1059–1071 (1990)
Chen, H., Wolff, L.: Polarization phase based method for material classification and object recognition in computer vision. International Journal of Computer Vision 28(1), 45–56 (1999)
Tominaga, S., Kimachi, A.: Polarization imaging for material classification. Optical Engineering 47(12), 123201-1–123201-14 (2008)
Drude, P.: The theory of optics, p. 278. Dover publications Inc., New York (1959)
Sarkar, M., Segundo, D.S., van Hoof, C., Theuwissen, A.: Integrated polarization analyzing CMOS image sensor. In: Proceedings of IEEE International Symposium on Circuits and Systems, pp. 621–624 (2010)
Brewster, D.: On the laws which regulate the polarization of light by reflection from transparent bodies. Hilosophical Transactions of the Royal Society of London 105, 128 (1815)
Gruev, V., der Spiegel, J.V., Engheta, N.: Advances in integrated polarization imaging sensors. In: IEEE Life Science Systems and Applications Workshop, pp. 62–65 (2009)
Siegal, R., Howell, J.R.: Thermal radiation heat transfer. McGraw-hill, New York (1981) ISBN: 1560328398
Gilberd, P.: The anomalous skin effect and the optical properties of metals. Journal of Physics F: Metal Physics 12, 1845–1860 (1982)
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Sarkar, M., Theuwissen, A. (2013). Material Classification Using CMOS Polarization Sensor. In: A Biologically Inspired CMOS Image Sensor. Studies in Computational Intelligence, vol 461. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34901-0_5
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DOI: https://doi.org/10.1007/978-3-642-34901-0_5
Publisher Name: Springer, Berlin, Heidelberg
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