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Surface Science Techniques pp 165–190Cite as

Grazing Incidence X-Ray Diffraction

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 51))

Abstract

The principles of grazing incidence X-ray diffraction (GIXD) are discussed. A sample of a crystalline material is composed of a surface region including its top layer and a bulk part. The effect of the surface region on the intensity of surface X-ray diffraction cannot be generally disregarded. With the grazing configuration this small intensity is optimized and the structural parameters of surfaces, interfaces, and thin films can be determined through the comparison between the estimated, or experimental, and calculated structure factors. For the estimation, the experimental procedures to measure GIXD profiles around reciprocal lattice points with the necessary corrections are presented. A synchrotron X-ray source and diffractometers employed to perform GIXD experiments are briefly described. We conclude with two examples of systems investigated by means of GIXD: an electrochemical interface of Ag(1 0 0) and an epitaxial thin film of Bi4Ti3O12 grown on a TiO2 (1 0 1) single crystal.

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Notes

  1. 1.

    Since X-ray diffraction intensity is proportional to electron density, low atomic number elements are weak scatterers.

  2. 2.

    This sphere is superimposed on the reciprocal space of a crystal with a radius of 1/λ. An incident wave vector starts from the center of the sphere to the origin of the reciprocal space. The sphere is used for determining the directions in which an incident X-ray or other beam will be diffracted by the crystal.

  3. 3.

    GIXD patterns clearly showed the two-by periodicity of one-dimensional Bi nano lines buried in a Si (0 0 1) crystal.

  4. 4.

    While a sample crystal satisfies the Bragg condition for a forbidden reflection, diffraction does not occur because its structure factor is zero.

  5. 5.

    When an X-ray beam penetrates through a material, the intensity decreases with distance x in proportion to exp (−μx).

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Authors and Affiliations

  1. Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS), Kouto 1-1-1, Sayo, Hyogo, 679-5148, Japan

    Osami Sakata

  2. Department of Applied Chemistry and Biotechnology, Graduate School of Engineering, Chiba University, Yayoi-cho 1-33, Inage-ku, Chiba, 263-8522, Japan

    Masashi Nakamura

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  1. Osami Sakata
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  2. Masashi Nakamura
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Correspondence to Osami Sakata .

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Editors and Affiliations

  1. , Department of Physics, University of Genoa, Via Dodecaneso 33, Genoa, 16146, Italy

    Gianangelo Bracco

  2. , Department of Physics and Technology, University of Bergen, Allegaten 55, Bergen, 5007, Svalbard

    Bodil Holst

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Sakata, O., Nakamura, M. (2013). Grazing Incidence X-Ray Diffraction. In: Bracco, G., Holst, B. (eds) Surface Science Techniques. Springer Series in Surface Sciences, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34243-1_6

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