Abstract
This paper presents techniques used for integrating numerous 3D directional measurements obtained during digitization of various classes of works of art, with dimensions up to 2000mm x 500mm x 500mm. Most of those measurements are of very high resolution (up to 10000 points per mm2) and small volume (50 mm x 50 mm x 20 mm). In this paper, a hybrid method used for integrating those measurements into complete model is described. It is based on geometrical, color and texture features of digitized surface. Global relaxation, performed as a final stage, ensures uniform distribution of fitting errors between measurements within the whole model.
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Sitnik, R.: New method of structured light measurement system calibration based on adaptive and effective evaluation of 3D-phase distribution. In: Proceedings of SPIE 5854, pp. 109–117 (2005)
Blais, F., Taylor, J., Cournoyer, L., Picard, M., Borgeat, L., Godin, G., Beraldin, J.A., Rioux, M., Lahanier, C.: Ultra High-Resolution 3D Laser Color Imaging of Paintings: the Mona Lisa by Leonardo da Vinci. Published at the 7th International Conference on Lasers in the Conservation of Artworks, Madrid, Spain, September 17-21 (2007)
Ikeuchi, K., Miyazaki, D.: Digitally Archiving Cultural Objects. Springer (2008) ISBN: 978-0-387-75806-0
Chen, C.S., Hung, Y.P., Cheng, J.B.: A Fast Automatic Method for Registration of Partially Overlapping Range Images. In: Proceedings of International Conference on Computer Vision, pp. 242–248 (1992)
Rusinkiewicz, S., Levoy, M.: Efficient Variants of the ICP Algorithm. In: Proceedings of the Third International Conference on 3D Digital Imaging and Modeling (3DIM), pp. 145–152 (2001)
Rusu, R.B., Blodow, N., Marton, Z.C., Beetz, M.: Aligning point cloud views using persistent feature histograms. In: Proceedings of IROS 2008 IEEE/RSJ International Conference, pp. 3384–3391 (2008)
Besl, P.J., McKay, N.D.: A Method for Registration of 3-D Shapes. IEEE Transactions on Pattern Analysis and Machine Intelligence 14(2), 239–256 (1992)
Fischler, M.A., Bolles, R.C.: Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography. Communications of the ACM 24(6), 381–395 (1981)
Karaszewski, M., Sitnik, R., Bunsch, E.: On-line, collision-free positioning of a scanner during fully automated three-dimensional measurement of cultural heritage objects. Robotics and Autonomous Systems (in press, 2012)
Mikolajczyk, K., Tuytelaars, T., Shmid, C., Zisserman, A., Matas, J., Schaffalitzky, F., Kadir, T., Van Gool, L.: An affine invariant interest point detector. In: Proceedings of the 8th International Conference on Computer Vision, pp. 128–142 (2002)
Gatzke, T., Grimm, C., Garland, M., Zelinka, S.: Curvature maps for local shape comparison. In: Proceedings of the International Conference on Shape Modeling and Applications (2005)
Sitnik, R., Krzeslowski, J., Maczkowski, G.: Archiving shape and appearance of cultural heritage objects using structured light projection and multispectral imaging. Optical Engineering 51(2), 021115–021118 (2012)
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Karaszewski, M., Holowko, E., Wojsz, J., Sitnik, R., Bunsch, E. (2012). Automated View Integration Techniques for Numerous 3D Clouds of Points. In: Ioannides, M., Fritsch, D., Leissner, J., Davies, R., Remondino, F., Caffo, R. (eds) Progress in Cultural Heritage Preservation. EuroMed 2012. Lecture Notes in Computer Science, vol 7616. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34234-9_43
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DOI: https://doi.org/10.1007/978-3-642-34234-9_43
Publisher Name: Springer, Berlin, Heidelberg
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