Abstract
In-situ monitoring is highly convenient for obtaining profound insight into growth processes. In particular, real time imaging during film formation allows an unambiguous identification of growth modes such as Frank van der Merwe Layer-by-Layer, Stranski–Krastanov or Vollmer–Weber island growth. Here, we discuss the benefits of using Low Energy Electron Microscopy (LEEM) as a tool for the application relevant deposition of para-Sexiphenyl on graphene and Ir{111} substrates. Changes in the growth mode can be identified and interpreted with ease directly from the real time LEEM observations. Examples of all three principal growth modes will be discussed together with a state of the art structure determination. The presented system is a prime candidate for the possible fabrication of thin organic light emitting diodes. It combines an optically active organic semiconductor with the transparent, flexible, and conductive electrode material graphene.
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Notes
- 1.
The Γ-function is an extension of the factorial function to real and complex numbers. However, the argument is shifted down by 1. For positive integer values of n: Γ(n)=(n−1)!.
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Hlawacek, G., Khokhar, F.S., van Gastel, R., Zandvliet, H.J.W., Poelsema, B., Teichert, C. (2013). In-situ Observation of Organic Thin Film Growth on Graphene. In: Sitter, H., Draxl, C., Ramsey, M. (eds) Small Organic Molecules on Surfaces. Springer Series in Materials Science, vol 173. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33848-9_5
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DOI: https://doi.org/10.1007/978-3-642-33848-9_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-33847-2
Online ISBN: 978-3-642-33848-9
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