Abstract
This paper focuses in the development of an electromagnetic compatibility test system for voltage dips immunity and supply current harmonic distortion. Voltage dips analysis is a complex stochastic issue, since it involves a large variety of random factors, such as: type of short circuits in the power system, location of faults, protective system performance and atmospheric discharges. On the other hand, harmonic distortion is a steady state disturbance which is caused by the rectifier employed in energy-efficient technology. This paper describes a system for voltage dips testing according to IEC 61000-4-11 norm and it also test the supply current harmonic distortion according to the limits given in IEC 61000-3-2. Results of the dips test are represented in a power acceptability curve obtained with the test levels of the norm; the harmonic distortion is represented in a bar chart compared with the IEC 61000-3-2 limits.
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References
De la Rosa, J.J.G., Moreno Muñoz, A., Gil de Castro, A., Pallarés, V., Sánchez Castillejo, J.A.: A web based distributed measurement system for electrical power quality assessment. Measurement Journal of the International Measurement Confederation 43(6), 771–780 (2010)
Gil de Castro, A., Moreno Muñoz, A., de la Rosa, J.J.G.: Characterizing the Harmonic Attenuation Effect of High Pressure Sodium Lamps. In: 14th IEEE International Conference on Harmonics and Quality of Power (ICHPQ), Italy (September 2010)
Gil de Castro, A., Moreno Muñoz, A., Pallarés, V., de la Rosa, J.J.G.: Improving Power Quality Immunity in Factory Automation. Power Electronics Technology 35(5), 28–32 (2009)
Moreno Muñoz, A., de la Rosa, J.J.G.: Voltage sag in highly automated factories. IEEE Industry Application Society Annual Meeting, art. no. 4659120 (2008)
Haefely EMC Technology, http://www.haefelyemc.com
Kyei, J., Ayyanar, R., Heydt, G., Thallam, R., Blevins, J.: The design of power acceptability curves. IEEE Transaction on Power Delivery 7(3), 828–833 (2002)
Information Technology Industry Council (ITI), ITI (CBEMA) curve application note (October 2000)
Stephens, M., McGranaghan, M., Bollen, M.: Evaluation Voltage Dips Immunity of Industrial Equipment. In: 18th International Conference and Exhibition on Electricity Distribution, Turin, pp. 1–5 (2005)
Acarkan, B., Erkan, K.: Harmonics modeling and harmonic activity analysis of equipments with switch mode power supply using MATLAB and simulink. In: 2007 Proceedings of IEEE International Electric Machines and Drives Conference, IEMDC 2007, art. no. 4270692, pp. 508–513 (January 2007)
Mansoor, A., Grady, W.M., Chowdhury, A.H., Samotyj, M.J.: An investigation of harmonic attenuation and diversity among distributed single-phase power electronic loads. IEEE Transaction Power Delivery 10(1), 467–473 (1995)
Keus, A.K., Van Coller, J.M., Koch, R.G.: A test facility for determining the response of industrial equipment to voltage dips (sags). In: International Conference on Electric Machines and Drives, IEMD, p. 210 (May 1999)
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© 2012 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering
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Pérez, F.D. et al. (2012). Virtual Instrumentation Applied to Electromagnetic Compatibility Testing. In: Liñán Reyes, M., Flores Arias, J.M., González de la Rosa, J.J., Langer, J., Bellido Outeiriño, F.J., Moreno-Munñoz, A. (eds) IT Revolutions. IT Revolutions 2011. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 82. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-32304-1_4
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DOI: https://doi.org/10.1007/978-3-642-32304-1_4
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