Abstract
In this tutorial we describe the basic principles of the ion implantation technique and we demonstrate that emission Mössbauer spectroscopy is an extremely powerful technique to investigate the atomic and electronic configuration around implanted atoms. The physics of dilute atoms in materials, the final lattice sites and their chemical state as well as diffusion phenomena can be studied. We focus on the latest developments of implantation Mössbauer spectroscopy, where three accelerator facilities, i.e., Hahn-Meitner Institute Berlin, ISOLDE-CERN and RIKEN, have intensively been used for materials research in in-beam and on-line Mössbauer experiments immediately after implantation of the nuclear probes.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
E.L. Wolf, Nanophysics and Nanotechnology: An Introduction to Modern Concepts in Nanoscience (Wiley-VCH, New York, 2006)
Electron Microscope
C. Kittel, Introduction to Solid State Physics, 8th edn. (Wiley, New York, 2005
R.L. Mössbauer, Z. Physik, 151, 124 (1958)
R.L. Mössbauer, Naturwissenschaften, 45, 538 (1958)
R.L. Mössbauer, Z. Naturforsch. 14a, 211 (1959)
Hyperfine Interactions
L.C. Feldman, J.W. Mayer (eds.), Fundamentals of Surface and Thin Film Analysis. (Appleton and Lange, New York, 1986)
J.F. Ziegler, J.P. Biersack, U. Littmark, The Stopping and Range of Ions in Solids ed. (Pergamon Press, New York, 1985); http://www.srim.org/
G. Langouche, Hyperfine Interaction of Defects in Semiconductors (Elsevier, Amsterdam, 1992)
G. Langouche, in Mössbauer Spectroscopy Applied to Inorganic Chemistry, G. Long, F. Grandjean (eds.), Vol. 3, (Plenum Press, New York and London, 1989), pp. 445–512
H. de Waard, S.A. Drentje, Phys. Lett. 20, 38 (1966)
G.L. Latshaw, Stanford University, PhD Thesis, 1971
L. Niesen, Hyperfine interact. 13, 65–88 (1983)
G. Weyer, Hyperfine Interact. 27, 249–262 (1986)
H. de Waard, Hyperfine Interact. 40, 31–48 (1988)
G. Langouche, Hyperfine Interact. 45, 199–216 (1989)
G. Langouche, Hyperfine Interact. 72, 217–228 (1992)
M. de Coster, H. Pollak, S. Amelinckx, in Proceedings of the 2nd International Conference on the Mössbauer Effect, D.M.J. Compton, A.H. Schoen (eds.) (Wiley, New York, 1962), p. 289
P.C. Norem, G.K. Wertheim, J. Phys. Chem. Solids 23, 1111 (1962)
G. Langouche, M. de Potter, I. Dézsi, M. Van Rossum, Radiat. Effect Lett. 67, 404 (1982)
J.A. Sawicki, B.D. Sawicka, Phys. Stat. Sol. b 86, K159 (1978)
G.L. Latshaw, P.B. Russell, S.S. Hanna, Hyperfine Interact. 8, 105–127 (1980)
J.A. Sawicka, B.D., Sawicki, J.A. Phys. Lett. A 64, 311 (1977)
G. Langouche, M. de Potter, Nucl. Instrum. Methods B 19/20, 322 (1987)
P. Schwalbach, S. Laubach, M. Hartick, E. Kankeleit, B. Keck, M. Menningen, R. Sielemann, Phys. Rev. Lett. 64, 1274 (1990)
G. Langouche, M. de Potter, D. Schroyen, Phys. Rev. Lett. 53, 1364 (1984)
W. Bergholz, Physica B 16, 312 (1983)
M. Menningen, R. Sieleman, G. Vogl, Y. Yoshida, K. Bonde-Nielsen, G. Weyer, Europhys. Lett. 3, 927–933 (1987)
A. Heiming, K.H. Steinmetzt, G. Vogl, Y. Yoshida, J. Phys. F: Met. Phys. 18, 1491–1503 (1988)
Y. Yoshida, M. Menningen, R. Sielemann, G. Vogl, G. Weyer, K. Schroeder, Phys. Rev. Lett. 61, 195 (1988)
Y. Yoshida, Hyperfine Interact. 47, 95–113 (1989)
R. Sielemann, Y. Yoshida, Hyperfine Interact. 68, 119–130 (1991)
B. Keck, R.Sielemann, Y. Yoshida, Phys. Rev.Lett.
D. Forkel-Wirth, ISOLDE laboratory portrait. Hyperfine Interact. 129 (2000)
G. Weyer, Hyperfine Interact. 129, 371–390 (2000)
G. Weyer, J.W. Petersen, S. Damgaard, H.L. Nielsen, Phys. Rev. Lett. 44, 155–157 (1980)
H.P. Gunnlaugsson, G. Weyer, M. Dietrich and the ISOLDE collaboration, M. Fanciulli, K. Bharuth-Ram, R. Sielemann, Appl. Phys. Lett. 80, 2657–2659 (2002)
Y. Kobayashi, Y. Yoshida et al., Hyperfine Interact. 126, 417 (2000)
Y. Yoshida, K. Kobayashi et al., Defect Diffus. Forum 194–199, 611 (2001)
Y. Yoshida; ALTECH 2003 Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 479 (2003)
Y. Yoshida, Y. Kobayashi, K. Hayakawa, K. Yukihira, A. Yoshida, H. Ueno, F. Shimura, F. Ambe; Physica B, 376-377, 69 (2006)
Y. Yoshida, K. Suzuki, Y. Kobayashi, T. Nagatomo, Y. Akiyama, K. Yukihira, K. Hayakawa, H. Ueno, A. Yoshimi, D. Nagae, K. Asahi, G. Langouche, Hyperfine Interact. 204, 133–137 (2012)
A.A. Istratov, H. Hieslmair and E. R. Weber; Appl. Phys. A 69, 13 (1999)
S. K. Estreicher, M. Sanati, N. Gonzalez Szawacki, Phys. Rev. B, 77, 125214 (2008)
J. Kübler, A. E. Kumm, H. Overhof, P. Schwalbach, M. Hartick, E. Kankeleit, B. Keck, L.Wende, R.Sielemann, Z. Phys., B 92, 155 (1993)
Y. Yoshida, S. Horie, K. Niira, K. Fukui and K. Shirasawa; Physica B, 376–377, 227 (2006)
T. Diaz de la Rubia and G. H. ilmer, Phys. Rev.Lett., 74, 2507-2510 (1995)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Langouche, G., Yoshida, Y. (2013). Ion Implantation. In: Yoshida, Y., Langouche, G. (eds) Mössbauer Spectroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-32220-4_6
Download citation
DOI: https://doi.org/10.1007/978-3-642-32220-4_6
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-32219-8
Online ISBN: 978-3-642-32220-4
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)