Abstract
The static linearity of a D/A-converter is determined by the mismatch of the DAC-elements. “Matching” denotes the achievable degree of similarity of nominally identical devices and is ultimately limited by random fluctuations of process parameters during the fabrication of the integrated circuit. The resulting “random mismatch” solely depends on the specific process technology and is found to be inversely proportional to the device dimensions. In general, the statistical properties of the electrical parameters of closely spaced integrated circuit elements subject to random mismatch can be described by a normal distribution [39].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
Usually the matching constants are specified for transistor pairs. The single-device deviation from a (hypothetical) ideal device is then given by dividing the “pairwise” matching constants by \(\sqrt{2}\).
- 2.
This is equivalent to having \({2}^{{M}_{L}} - 1\) independent versions of the lower segments, such that no element thereof is used twice in any major-carry transition.
- 3.
Only a code-by-code calibration of the overall converter characteristic is able to correct also the static error introduced by the finite output impedance of the current cells. This can, e.g., be achieved with the method described in Sect. 3.3.4.
- 4.
An exception are perhaps \(\Sigma \Delta \)-DACs with low physical resolution. With a small number of DAC unit cells the converter can indeed be designed for an accuracy approaching 14 bits, while still maintaining a reasonable silicon area. Of course, perfect layout is mandatory to even approach such a high degree of intrinsic matching.
- 5.
In an N-element unary array the number of possible combinations that represent a digital input code k is given by the binomial factor \({r}_{k} = \left ({ N \atop k} \right ) = \frac{\left (N\right )!} {k!\left (N-k\right )!}\textrm{ , with }k \in [0; N - 1]\).
- 6.
After 1 ∕ f rep s, the index pointer reaches again its starting point. Therefore, f rep is the fundamental frequency of the CLA-cycle.
- 7.
Each output branch of the current folder must carry the full-scale current plus some extra current to prevent the cascode transistors from turning off near full scale.
- 8.
Hence the name dynamic current copying.
References
Burr-Brown, PCM1702: BiCMOS advanced sign magnitude 20-bit DIGITAL-TO-ANALOG CONVERTER. Datasheet (1993), www.ti.com
T. Guy, L. Trythall, A. Brodersen, A sixteen-bit monolithic bipolar DAC. IEEE J. Solid-State Circ. 17(6), 1127–1132 (1982)
J.R. Naylor, A complete high-speed voltage output 16-bit monolithic DAC. IEEE J. Solid-State Circ. 18(6), 729–735 (1982)
R.v.d. Plassche, Integrated Analog-to-Digital and Digital-to-Analog Converters (Kluwer Academic Publishers, 1994). ISBN:0-7923-9436-4
C.-H. Lin, K. Bult, A 10-b, 500-MSample/s CMOS DAC in 0.6 mm 2. IEEE J. Solid-State Circ. 33(12), 1948–1958 (1998)
A. Van den Bosch, M. Steyaert, W. Sansen; Static and Dynamic Performance Limitations for High Speed D/A Converters (Kluwer Academic Publishers, 2004). ISBN:1-4020-7761-0
P. Kinget, Device mismatch and tradeoffs in the design of analog circuits. IEEE J. Solid-State Circ. 40(6), 1212–1224 (2005)
J. Croon, W. Sansen, H. Maes, Matching Properties of Deep Submicron MOS Transistors (Springer, New York, 2005). ISBN:0-387-24314-3
M. Pelgrom, A. Duinmaijer, A. Welbers, Matching properties of mos transistors. IEEE J. Solid-State Circ. 24(5), 1433–1440 (1989)
J. Bastos, A. Marques, M. Steyaert, W. Sansen, A 12-bit intrinsic accuracy high-speed CMOS DAC. IEEE J. Solid-State Circ. 33(12), 1959–1969 (1998)
M. Clara, W. Klatzer, B. Seger, A. Di Giandomenico, L. Gori, A 1.5V 200MS/s 13b 25mW DAC with Randomized Nested Background Calibration in 0. 13μm CMOS. IEEE International Solid-State Circuits Conference 2007, Digest of Technical Papers, pp. 250–251, 2007
R. Schreier, G. Temes, Understanding Delta-Sigma Data Converters (Wiley, Hoboken, New Jersey, 2004). ISBN:0-471-46585-2
K. Laker, W. Sansen, Design of Analog Integrated Circuits and Systems (McGraw-Hill, New York, 1994). ISBN:00-703-6060-X
Y. Tsivids, C. McAndrew, Operation and Modeling of the MOS Transistor, 3rd edn. (Oxford University Press, New York, 2011). ISBN:978-0-19-517015-3
Y. Nakamura, T. Miki, A. Maeda, H. Kondoh, N. Yazawa, A 10-b 70-MS/s CMOS D/A converter. IEEE J. Solid-State Circ. 26(4), 637–642 (1991)
G. Van Der Plas, J. Vandenbussche, W. Sansen, M. Steyaert, G. Gielen, A 14-bit intrinsic accuracy Q 2 random walk CMOS DAC. IEEE J. Solid-State Circ. 34(12), 1708–1718 (1999)
K. Lakshmikumar, R. Hadaway, M. Copeland, Characterization and modeling of mismatch in MOS transistors for precision analog design. IEEE J. Solid-State Circ. 21(6), 1057–1066 (1986)
A. Papoulis, Probability, Random Variables, and Stochastic Processes, 3rd edn. (McGraw-Hill, 1991). ISBN 0-07-048477-5
G.I. Radulov, M. Heydenreich, R.W. van der Hofstad, J.A. Hegt, A.H.M. van Roermund, Brownian-bridge-based statistical analysis of the DAC INL caused by current mismatch. IEEE Trans. Circ. Syst. II: Analog Digital Signal Process. 54(2), 146–150 (2007)
M. Heydenreich, R. van der Hofstad, G.I. Radulov, Functionals of Brownian bridges arising in the current mismatch in D/A converters. Probab. Eng. Inform. Sci. 23, 149–172 (2009)
W. Feller, On the Kolmogorov-Smirnov limit theorems for empirical distributions. Ann. Math. Stat. 19(2), 177–189 (1948)
J. Pitman, M. Yor, On the distribution of ranked heights of excursions of a Brownian bridge. Ann. Probab. 29(1), 361–384 (2001)
A. Van den Bosch, M. Steyaert, W. Sansen, An accurate statistical Yield Model for CMOS Current-Steering D/A Converters, in Proceedings of the 2000 International Symposium on Circuits and Systems, vol. 4, pp. IV–105 – IV–108, 2000
K. Lakshmikumar, M. Copeland, R. Hadaway, Reply to “comment on ‘characterization and modeling of mismatch in MOS transistors for precision analog design’”. IEEE J. Solid-State Circ. 23(1), 295–296 (1988)
N. Smirnov, Table for estimating the goodness of fit of empirical distributions. Ann. Math. Stat. 19(2), 279–281 (1948)
B. Razavi, Principles of Data Conversion System Design (Wiley-IEEE Press, New York, 1994). ISBN:978-0-7803-1093-3
S. Luschas, H.-S. Lee, Output Impedance Requirements for DACs. Proceedings of the 2003 International Symposium on Circuits and Systems, vol. 1, pp. I–861 – I–864, 2003
W. Schofield, D. Mercer, L.St. Onge, A 16b 400MS/s DAC with < − 80dBc IMD to 300MHz and < − 160dBm/Hz noise power spectral density. IEEE International Solid-State Circuits Conference 2003, Digest of Technical Papers, pp. 126–129, 2003
J.W. Bruce, Dynamic element matching techniques for data converters, Ph.D. dissertation, University of Nevada, Las Vegas, 2000
F. Chen, B. Leung, A high resolution multibit sigma-delta modulator with individual level averaging. IEEE J. Solid-State Circ. 30(4), 453–460 (1995)
S. Norsworthy, R. Schreier, G. Temes, Delta-Sigma Data Converters: Theory, Design and Simulation (Wiley-IEEE Press, New York, 1996). ISBN:0-7803-1045-4
R. Baird, T. Fiez, Improved \(\Delta \Sigma \) DAC linearity using data weighted averaging, in Proceedings of the 1995 International Symposium on Circuits and Systems, vol. 1, pp. I–13 – I–16, 1995
I. Fujimori, L. Longo, A. Hairapetian, K. Seiyama, S. Kosic, C. Jun, S.L. Chan, A 90-dB SNR 2.5-MHz output-rate ADC using cascaded multibit delta-sigma modulation at 8x oversampling ratio. IEEE J. Solid-State Circ. 35(12), 1820–1828 (2000)
M. Clara, A. Wiesbauer, W. Klatzer, Nonlinear distortion in current-steering D/A-converters due to asymmetrical switching errors, in Proceedings of the 2004 International Symposium on Circuits and Systems, vol. 1, pp. I–285 – I–288, 2004
B. Leung, S. Sutarja, Multibit \(\Sigma \)-\(\Delta \) A/D converter incorporating a novel class of dynamic element matching techniques. IEEE Trans. Circ. Syst. II: Analog Digital Signal Process. 39(1), 35–51 (1992)
L. Carley, A noise-shaping coder topology for 15+ bit converters. IEEE J. Solid-State Circ. 24(2), 267–273 (1989)
H. Jensen, I. Galton, A low-complexity dynamic element matching DAC for direct digital synthesis. IEEE Trans. Circ. Syst. II: Analog Digital Signal Process. 45(1), 13–27 (1998)
I. Galton, Spectral shaping of circuit errors in digital-to-analog converters. IEEE Trans. Circ. Syst. II: Analog Digital Signal Process. 44(10), 808–817 (1997)
A. Yasuda, H. Tanimoto, T. Iida, A third-order \(\Delta \Sigma \) modulator using second-order noise-shaping dynamic element matching. IEEE J. Solid-State Circ. 33(12), 1879–1886 (1998)
E. Fogelman, J. Welz, I. Galton, An audio ADC delta-sigma modulator with 100-dB peak SINAD and 102-dB DR using a second-order mismatch-shaping DAC. IEEE J. Solid-State Circ. 36(3), 339–348 (2001)
T. Shui, R. Schreier, F. Hudson, Mismatch shaping for a current-mode multibit delta-sigma DAC. IEEE J. Solid-State Circ. 34(3), 331–338 (1999)
W. Schofield, D. Mercer, L.St. Onge, A 16b 400MS/s DAC with < − 80dBc IMD to 300MHz and < − 160dBm/Hz noise power spectral density. IEEE International Solid-State Circuits Conference 2007, Visuals Supplement to the Digest of Technical Papers, pp. 90–91, 2003
Q. Huang, P.A. Francese, C. Martelli, J. Nielsen, A 200MS/s 14b 97mW DAC in 0.18μm CMOS. IEEE International Solid-State Circuits Conference 2004, Digest of Technical Papers, pp. 364–532, 2004
M. Clara, W. Klatzer, D. Gruber, A. Marak, B. Seger, W. Pribyl, A 1.5V 13bit 130–300MS/s self-calibrated DAC with active output stage and 50MHz signal bandwidth in 0. 13μm CMOS, in Proceedings of the 34th European Solid-State Circuits Conference, pp. 262–265, 2008
R. Craven, An integrated circuit 12-bit D/A converter. IEEE International Solid-State Circuits Conference 1975, Digest of Technical Papers, pp. 40–41, 1975
J. Teichmann, K. Burger, W. Hasche, J. Herrfurth, G. Taschner, One time programming (OTP) with Zener diodes in CMOS processes, in Proceedings of the 33th European Solid-State Device Research Conference, pp. 433–436, 2003
G. Erdi, A precision trim technique for monolithic analog circuits. IEEE J. Solid-State Circ. 10(6), 412–416 (1975)
D. Comer, A monolithic 12-bit DAC. IEEE Trans. Circ. Syst. II: Analog and Digital Signal Process. 25(7), 504–509 (1978)
C.-H. Yang, C.-M. Su, Method of forming a metal fuse on semiconductor devices, U.S. Patent 6,835,642, 28 Dec 2004
J. Fellner, P. Boesmueller, H. Reiter, Lifetime study for a poly fuse in a 0.35μm polycide CMOS process. IEEE International Reliability Physics Symposium, pp. 17–21, 2005
P. Pessl, R. Gaggl, J. Hohl, D. Giotta, J. Hauptmann, A four-channel ADSL2+ analog front-end for CO applications with 75 mW per channel, built in 0. 13μm CMOS. IEEE J. Solid-State Circ. 39(12), 2371–2378 (2004)
M. Tiilikainen, A 14-bit 1.8-V 20-mW 1-mm 2 CMOS DAC. IEEE J. Solid-State Circ. 36(7), 1144–1147 (2001)
G.I. Radulov, P. Quinn, J.A. Hegt, A.H.M. van Roermund, An on-chip self-calibration method for current mismatch in D/A converters, in Proceedings of the 31th European Solid-State Circuits Conference, pp. 169–172, 2005
Y. Cong, R.L. Geiger, A 1.5-V 14-bit 100-MS/s self-calibrated DAC. IEEE J. Solid-State Circ. 38(12), 2051–2060 (2003)
A. Bugeja, B.-S. Song, A Self-Trimming 14-b 100-MS/s CMOS DAC. IEEE J. Solid-State Circ. 34(12), 1841–1852 (2000)
G. Wegmann, E. Vittoz, Very accurate dynamic current mirrors. Electron. Lett. 25, 644–646 (1989)
G. Wegmann, E.A. Vittoz, Analysis and improvements of accurate dynamic current mirrors. IEEE J. Solid-State Circ. 25(3), 699–706 (1990)
W. Groeneveld, H. Schouwenaars, H. Termeer, A self calibration technique for monolithic high-resolution D/A converters. IEEE J. Solid-State Circ. 24(6), 1517–1522 (1989)
E. Vittoz, G. Wegmann, Dynamic current mirrors. in Analog IC Design: the Current-mode Approach, ed. by C. Tomazou et al. (Peter Peregrinus, 1990), pp. 297–326. ISBN:0 86341 297 1
G. Wegmann, E. Vittoz, F. Rahali, Charge injection in analog MOS switches. IEEE J. Solid-State Circ. 22(6), 1091–1097 (1987)
C.J.J. Dachs, R. Surdeanu, D. Guyot, A. Parlangeli, Y.V. Ponomarev, P.A. Stolk, Junction leakage in advanced CMOS technologies, in Proceedings of the 31th European Solid-State Device Research Conference, pp. 175–178, 2001
K.M. Cao, W.-C. Lee, W. Liu, X. Jin, P. Su, S.K.H. Fung, J.X. An, B. Yu, C. Hu, BSIM4 gate leakage model including source-drain partition. Technical Digest of the International Electron Devices Meeting IEDM’00, pp. 815–818, 2000
R. Suarez, P. Gray, D. Hodges, All-MOS charge-redistribution analog-to-digital conversion techniques. II. IEEE J. Solid-State Circ. 10(6), 379–385 (1975)
K. Falakshahi, C.-K. Yang, B. Wooley, A 14-bit, 10-Msamples/s D/A converter using multi-bit \(\Sigma \Delta \) modulation. IEEE J. Solid-State Circ. 34(5), 607–615 (1999)
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Clara, M. (2013). Static Linearity. In: High-Performance D/A-Converters. Springer Series in Advanced Microelectronics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31229-8_3
Download citation
DOI: https://doi.org/10.1007/978-3-642-31229-8_3
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-31228-1
Online ISBN: 978-3-642-31229-8
eBook Packages: EngineeringEngineering (R0)