Abstract
Transient sensitivity information is useful in many EDA tools such as circuit optimizers. In this paper, we investigate the transient sensitivity computations in large-scale MOSFET circuits. Iterated Timing Analysis (ITA) is used as the fundamental algorithm to undertake both timing and sensitivity simulations. A modified Direct Approach for sensitivity computation is proposed, which is called Adaptive Direct Approach that considers the number of design parameters and sizes of subcircuits. All proposed methods have been implemented and tested to justify their outstanding performance better than previous works.
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References
Hocevar, D.A., Yang, P., Trick, T.N., Epler, B.D.: Transient sensitivity computation for MOSFET circuits. IEEE Trans., Computer-aided Design CAD-4, 609–620 (1985)
Director, S.W., Rohrer, R.A.: The generalized adjoint network and network sensitivities. IEEE Trans. Circuit Theory CT-16, 318–323 (1969)
Chen, C.J., Feng, W.S.: Relaxation-based transient sensitivity computations for MOSFET circuits. IEEE Trans. on Computer-aided Design 14(2), 173–185 (1995)
Saleh, R.A., Newton, A.R.: The exploitation of latency and multirate behavior using nonlinear relaxation for circuit simulation. IEEE Trans., Computer-aided Design 8, 1286–1298 (1989)
Chen, C.J., Chen, B.C., Lee, C.J., Tsai, C.L., Chou, L.P., Chang, A.Y.: Methods to Enhance the Performance of Iterated Timing Analysis Algorithm. In: IEEE International Conference on Information and Automation, Harbin, China, June 20-23 (2010)
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© 2012 Springer-Verlag Berlin Heidelberg
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Chen, CJ. (2012). Transient Sensitivity Computations for Large-Scale MOSFET Circuits Using Iterated Timing Analysis and Adaptive Direct Approach. In: Deng, W. (eds) Future Control and Automation. Lecture Notes in Electrical Engineering, vol 173. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31003-4_46
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DOI: https://doi.org/10.1007/978-3-642-31003-4_46
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-31002-7
Online ISBN: 978-3-642-31003-4
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