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Design for Testability for Micro-mechatronic Systems

  • Gisela Lanza
  • Thomas Blank
  • Benjamin Haefner
Part of the Lecture Notes in Production Engineering book series (LNPE)

Abstract

The development and manufacturing of highly precise micro-mechatronic systems, such as MEMS applications, is a challenging task due to the complexity and variety of their manufacturing technologies, as well as their high quality requirements. Within the context of the product engineering process of micro-mechatronic systems, quality inspection by means of production measurement technology is a crucial factor. This paper presents a survey of the challenges regarding quality inspection of micro-mechatronic systems. Furthermore, a Design for Testability approach for these types of products is described and exemplary applications of its implementation are shown.

Keywords

Design for Testability Simultaneous Engineering micromechatronics MEMS MID TSV 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Gisela Lanza
    • 1
  • Thomas Blank
    • 2
  • Benjamin Haefner
    • 1
  1. 1.wbk Institute of Production ScienceKarlsruhe Institute of Technology (KIT)KarlsruheGermany
  2. 2.Institute for Data Processing and ElectronicsKarlsruhe Institute of Technology (KIT)KarlsruheGermany

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