Abstract
The answer to this question is quite obvious: in order to obtain the comprehensive impression about surrounding objects, one needs both of these sensation systems. Importantly, the information obtained visually and tactilely is not the same since different detection mechanisms are applied. This example provides a perception of diversity and similarity between detection mechanisms of three main high resolution microscopy techniques (transmission electron microscopy (TEM), scanning electron microscopy (SEM) and atomic force microscopy (AFM)) and human visual and tactile sensation systems.
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References
Ruska, E., Knoll, M.: Das Elektronenmikroskop. Z. Phys. 78, 318–339 (1932)
Sawyer, L.C., Grubb, D.T.: Polymer Microscopy, 2nd edn. Alden press, Oxford (1996)
Egerton, R.F.: Electron Energy-Loss Spectroscopy in the Electron Microscope. Plenum Press, New York (1986)
Isaacson, M., Johnson, D.: Ultramicroscopy 1, 33–52 (1975)
Ardenne, M.: Z. Phys. 109, 553–572 (1938)
Ardenne, M.: Z. Tech. Phys. 19, 407–416 (1938)
Knoll, M.: Z. Tech. Phys. 16, 467–475 (1935)
Reimer, L.: Image Formation in Low-Voltage Scanning Electron Microscopy. SPIE optical engineering press (ed by D. O`Shea), TT12
Binnig, G., Quate, C.F., Gerber, C.: Phys. Rev. Lett. 56, 930 (1986)
Wiesendanger, R.: Scanning Probe Microscopy and Spectroscopy. Cambridge university press, Cambridge (2003)
Giessibl, F.G.: Science 267, 68–72 (1995)
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© 2012 Springer-Verlag Berlin Heidelberg
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Mittal, V., Matsko, N.B. (2012). Introduction to Microscopy Techniques. In: Analytical Imaging Techniques for Soft Matter Characterization. Engineering Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-30400-2_1
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DOI: https://doi.org/10.1007/978-3-642-30400-2_1
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