Abstract
In software-based self-test (SBST) a microprocessor executes a set of test programs devised for detecting the highest possible percentage of faults. The main advantages of this approach are its high defect fault coverage (being performed at-speed) and the reduced cost (since it does not require any change in the processor hardware). SBST can also be used for on-line test of a microprocessor-based system. However, some additional constraints exist in this case (e.g. in terms of test length and duration, as well as intrusiveness). This paper faces the issue of automatically transforming a test set devised for manufacturing test in a test set suitable for on-line test. Experimental results are reported on an Intel 8051 microcontroller. Preliminary results have been published in [133].
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© 2012 Springer-Verlag Berlin Heidelberg
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Sanchez, E., Squillero, G., Tonda, A. (2012). Development of On-Line Test Sets for Microprocessors. In: Industrial Applications of Evolutionary Algorithms. Intelligent Systems Reference Library, vol 34. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27467-1_7
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DOI: https://doi.org/10.1007/978-3-642-27467-1_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-27466-4
Online ISBN: 978-3-642-27467-1
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