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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science pp 409–449Cite as

Practice of Surface and Interface Analysis with AES and XPS

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 49))

Abstract

To ensure optimum results of practical surface analysis studies, sample preparation, instrumental setup, and data acquisition have to be performed with care. Most important is avoidance of artifacts that may have a detrimental effect on the data, such as charging and beam effects. Any task begins with a precise identification of the problem and clarification of the question whether the task and the sample are compatible with surface analysis, and which result can be principally expected from the analytical study. Therefore, an analytical strategy is required.

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  1. Max-Planck-Institute for Intelligent Systems (formerly Max-Planck-Institute for Metals Research), Heisenbergstrasse 3, 70569, Stuttgart, Germany

    Professor Dr. Siegfried Hofmann

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Hofmann, S. (2013). Practice of Surface and Interface Analysis with AES and XPS. In: Auger- and X-Ray Photoelectron Spectroscopy in Materials Science. Springer Series in Surface Sciences, vol 49. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27381-0_8

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