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Robust Key Points Matching by Ordinal Measure

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Signal Processing, Image Processing and Pattern Recognition (SIP 2011)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 260))

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Abstract

Key point matching is based on finding reliable corresponding in the images. We propose ordinal based measure of image matching. The normalized cross correlation is one of the most accepted techniques for matching key points to facilitate the comparison of images. In the literature a number of fast implementation algorithms are available, there still are ways to improve expedite for many applications. We propose a general frame work for ordinal base image correspondence. In this paper, we introduce a new and effective method for matching the key points before applying cross correlation between neighbor key points that has been adapted to scale and rotation. Several examples are presented and the measure is evaluated on a set of test images.

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References

  1. Tsai, V.J.D., Huang, Y.T.: Automated image mosaicing. Journal of Chinese Institute of Engineers 28(2), 329–340 (2005)

    Article  Google Scholar 

  2. Harris, C.J., Stephens, M.: A combined corner and edge detector. In: Alvey Vision Conference, pp. 147–151 (March 1988)

    Google Scholar 

  3. Bolles, F.: Random sample consensus: a paradigm for model fitting with application to image analysis and automated artography. Communications of the ACM 24(6), 381–395 (1981)

    Article  MathSciNet  Google Scholar 

  4. Vincent, E.: On feature point matching, in the calibrated and uncalibrated contexts, between widely and narrowly separated images, Ph.D thesis (2004)

    Google Scholar 

  5. Carlo, T., Kanade, T.: Detection and Tracking of Point Features, Carnegie Mellon University Technical Report (April 1991)

    Google Scholar 

  6. Bhat, D.N., Nayar, S.K.: Ordinal measures for image correspondence. IEEE Transactions on Pattern Analysis and Machine Intelligence 20(4), 415–423 (1998)

    Article  Google Scholar 

  7. Bhat, D.N., Nayar, S.K.: Ordinal measures for visual correspondence. Columbia University, Computer Science, tech, rep. CUCS-009-96 (February 1996)

    Google Scholar 

  8. Gideon, R.A., Hollister, R.A.: A rank correlation coefficient. J. Am. Statistical Association 82(398), 656–666 (1987)

    Article  MathSciNet  MATH  Google Scholar 

  9. Kendall, M., Gibbons, J.D.: Rank correlation Methods, 5th edn. Edward Arnold, New York (1990)

    MATH  Google Scholar 

  10. http://personal.systembiology.net/ilya/ORDINAL.html

  11. http://en.wikipedia.org/wiki/Kendall_tau_rank_correlation_coefficient

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© 2011 Springer-Verlag Berlin Heidelberg

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Lakshmi, S., Sankaranarayanan, V. (2011). Robust Key Points Matching by Ordinal Measure. In: Kim, Th., Adeli, H., Ramos, C., Kang, BH. (eds) Signal Processing, Image Processing and Pattern Recognition. SIP 2011. Communications in Computer and Information Science, vol 260. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27183-0_37

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  • DOI: https://doi.org/10.1007/978-3-642-27183-0_37

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-27182-3

  • Online ISBN: 978-3-642-27183-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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