Abstract
To effectively evaluate and analyze performance of cluster tools in semiconductor manufacturing, the paper presents a throughput model for parallel cluster tools .For developping this model, the timing diagram is applied to describe the usage of the chamber and robot in parallel processing of cluster tools. Finally, the theoretical model which indicates the relationship between the number of chamber, processing time, transport time, and throughtput is deduced. This model can analyze and computer the wafer period and the batch period fast and accurately.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Perkinson, T.L., MacLarty, P.K., Gyurcsik, R.S., Cavin III, R.K.: Single-wafer cluster tool performance: An analysis of throughput. IEEE Trans. Semicond. Manufact. 7, 369–373 (1994)
Wood, S.C., Tripathi, S., Moghadam, F.: A generic model for cluster tool throughput time and capacity. In: 1994 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, pp. 194–199 (1994)
Perkinson, T.L., Gyurcsik, R.S., MacLarty, P.K.: Single-wafer cluster tool performance: An analysis of the effects of redundant chambers and revisitations sequences on throughput. IEEE Trans. Semicond. Manufact. 9, 384–400 (1996)
Venkatesh, S., Davenport, R., Foxhoven, P., Nulman, J.: A steady state throughput analysis of cluster tools: Dual-blade versus single-blade robots. IEEE Trans. Semicond. Manufact. 10, 418–423 (1997)
Srinivasan, R.S.: Modeling and performance analysis of cluster tools using Petri nets. IEEE Trans. Semicond. Manufact. 11, 394–403 (1998)
Zuberek, W.M.: Timed Petri nets in modeling and analysis of cluster tools. IEEE Transactions on Robotics and Automation 17, 562–575 (2001)
Zuberek, W.M.: Cluster tools with chamber revisiting-modeling and analysis using timed Petri nets. IEEE Trans. Semicond. Manufact. 17, 333–344 (2004)
LeBaron, H.T., Hendrickson, R.A.: Using emulation to validate a cluster tool simulation model. In: Proceedings of the 2000 Winter Simulation Conference Proceedings, vol. 2, pp. 1417–1422 (2000)
Gupta, A.K., Lendermann, P., Sivakumar, A.I., Priyadi, J.: Simulation analysis of cluster tool operations in wafer fabrication. In: Proceedings of the 2008 Winter Simulation Conference Proceedings, Austin, TX, pp. 2141–2142 (2008)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Xiuhong, Z., Haibin, Y., Jingtao, H. (2011). A General Throughput Model for Parallel Cluster Tools. In: Jiang, L. (eds) Proceedings of the 2011 International Conference on Informatics, Cybernetics, and Computer Engineering (ICCE2011) November 19-20, 2011, Melbourne, Australia. Advances in Intelligent and Soft Computing, vol 110. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25185-6_29
Download citation
DOI: https://doi.org/10.1007/978-3-642-25185-6_29
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-25184-9
Online ISBN: 978-3-642-25185-6
eBook Packages: EngineeringEngineering (R0)