Abstract
Wavelets are well adapted to describe local perturbations as well as global structures and so lead to an alternative representation of optical surfaces that combines a high approximation accuracy with a fast evaluation. We show that such a representation is usable in a ray trace algorithm to describe aspherical or free-form surfaces and give results for the achieved accuracy. Moreover the representation can be used for wavelet analysis of manufactured surfaces. We present numerical experiments for the detection of local errors, the separation of low and mid spatial frequency errors and the localization of regions with varying quality. A broad field of applications in optics, especially in tolerancing and manufacturing, is expected.
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© 2012 Springer-Verlag Berlin Heidelberg
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Jester, P., Menke, C., Urban, K. (2012). Wavelet Methods for the Representation, Analysis and Simulation of Optical Surfaces. In: Günther, M., Bartel, A., Brunk, M., Schöps, S., Striebel, M. (eds) Progress in Industrial Mathematics at ECMI 2010. Mathematics in Industry(), vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25100-9_42
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DOI: https://doi.org/10.1007/978-3-642-25100-9_42
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