Maximum Likelihood Estimation of Double Alternative Step-Stress Accelerated Life Test for Electronics

Abstract

For the application of double alternative step-stress accelerated life test in the life assessment of modern high reliable and long life electronic equipment, the maximum likelihood estimation (MLE) method is applied to make its life and reliability assessment in operating stress. With electronic product failure obeying exponential distribution, the likelihood equations of acceleration model parameters were established according to time convert. On the basis of acceleration model parameters and Fisher information matrix, the maximum likelihood estimation and approximate confidence interval of life expectancy in operating stress were acquired. In the end, random simulation method was used to prove the validity and advantages of the statistical method above compared with other method.