Abstract
Spatially resolved luminescence spectroscopy is a useful tool for the study of semiconductors with inhomogeneities of their properties on submicrometer scale and semiconductor nanostructures. In this chapter, basic operation principles, instrumentation, and advantages and disadvantages of micro-photoluminescence (μ-PL), confocal microscopy, scanning near-field optical microscopy (SNOM), and cathodoluminescence (CL) are discussed.
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T.R. Corle, G.S. Kino, Confocal Scanning Optical Mocroscopy and Related Imaging Systems, p. 39 (Academic, San Diego, 1996)
J.B. Pawley, Handbook of BiologicalConfocal Microscopy, 2nd edn. (Plenum, New York, 1995)
D.B. Murphy, Fundamentals of Light Microscopy and Electronic Imaging (Wiley, New York, 2001)
R. Pike, D. Chana, P. Neocleous, Sh. Jiang, in Optical Imaging and Microscopy, ed. by P. Török, F.-J Kao (Springer, Heidelberg, 2007)
P.L. Lu, in Handbook of Microscopy for Nanotechnology, ed. by N. Yao, Z.L. Wang (Kluwer, Boston, 2005)
S. Hell, E.H.K. Stelzer, J. Opt. Soc. Am. A, 9, 2159 (1992)
K. Okamoto, A. Kaneta, Y. Kawakami, S. Fujita, J. Choi, M. Terazima, T. Mukai, J. Appl. Phys. 98, 064503 (2005)
D. Dobrovolskas, J. Mickevičius, E. Kuokštis, G. Tamulaitis, M. Shur, M. Shatalov, J. Yang, R. Gaska, J. Phys. D: Appl. Phys. 44 135104 (2011)
E.H. Synge, Philos. Mag. 6, 356 (1928)
E.H. Synge, Philos. Mag. 13, 297 (1932)
E.A. Ash, G. Nicholls, Nature 237, 510 (1972)
H.A. Bethe, Phys. Rev. 66, 163 (1944)
C.J. Bouwkamp, Philips Res. Rep. 5, 321 (1950)
C.J. Bouwkamp, Philips Res. Rep. 5, 401 (1950)
L. Novotny, D.W. Pohl, in O. Marti, R. Möler (eds), Photons and Local Probes (Kluwer, The Netherlands, 1996)
E. Betzig, J.K. Trautmann, T.D. Harris, J.S. Weiner, R.L. Kostelak, Science 251, 1468 (1991)
B. Knoll, F. Keilmann, A. Kramer, R. Guckenberger, Appl. Phys. Lett. 70, 2667 (1997)
L. Novotny, D.W. Pohl, P. Regli, J. Opt. Soc. Am. A 11, 1768 (1994)
D.W. Pohl, in Advances in Optical and Electron Microscopy, ed. by C.J.R. Sheppard, T. Mulvey (Academic, London, 1990)
G.A. Valaskovic, M. Holton, G.H. Morrison, Appl. Opt. 34, 1215 (1995)
T. Saisaki, K. Matsuda, Appl. Phys. Lett. 74, 2773 (1999)
T. Matsumoto, M. Ohtsu, J. Lightwave Technol. 14, 2224 (1996)
N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman, R.G. Tack, F.B. Segerink, B. Bölger, Appl. Phys. Lett. 62, 461 (1993)
D.-M. Yeh, C.-F. Huang, C.-Y. Chen, Y.-C. Lu, C.C. Yang, Appl. Phys. Lett. 91, 171103 (2007)
C.-F. Lu, C.-H. Liao, C.-Y. Chen, C. Hsieh, Y.-W. Kiang, C.C. Yang, Appl. Phys. Lett. 96, 261104 (2010)
A. Klar, M. Perner, S. Grosse, G. von Plessen, W. Spirkl, J. Feldmann, Phys. Rev. Lett. 80, 4249 (1998)
S.A. Maier, H.A. Atwater, Appl. Phys. Lett. 98, 011101 (2005)
E. Ozbay, Science 311, 189 (2006)
L. Novotny, S.J. Stranick, Annu. Rev. Phys. Chem. 57, 303 (2006)
R.D. Grober, T.D. Harris, J.K. Trautman, E. Betzig, Rev. Sci. Instrum. 65, 626 (1994)
E. Betzig, J.K. Trautman, T.D. Harris, J.S. Weiner, R.L. Kostelak, Science 251, 1468 (1991)
A. Kaneta, M. Funato, Y. Kawakami, Phys. Rev. B 78, 125317 (2008)
A. Kaneta, T. Hashimoto, K. Nishimura, M. Funato, Y. Kawakami, Appl. Phys. Express 3, 102102 (2010)
A. Kaneta, K. Okamoto, Y. Kawakami, Sh. Fujita, G. Marutsuki, Y. Narukawa, T. Mukai, Appl. Phys. Lett. 81, 4353 (2002)
K. Okamoto, K. Inoue, Y. Kawakami, Sh. Fujita, M. Terazima, A. Tsujimura, I. Kidoguchi, Rev. Sci. Instrum. 74, 575 (2003)
K. Okamoto, A. Scherer, Y. Kawakami, Appl. Phys. Lett. 87, 161104 (2005)
R.D. Grober, T.D. Harris, J.K. Trautman, E. Betzig, Rev. Sci. Instrum. 65, 626 (1994)
G. Behme, A. Richter, M. Süptitz, Ch. Lienau, Rev. Sci. Instrum. 68, 3458 (1997)
V. Liuolia, A. Pinos, S. Marcinkeviius, Y.D. Lin, H. Ohta, S.P. DenBaars, S. Nakamura, Appl. Phys. Lett. 97, 151106 (2010)
A. Hangleiter, F. Hitzel, C. Netzel, D. Fuhrman, U. Rossow, G. Ade, P. Hinze, Phys. Rev. Lett. 95, 127402 (2005)
B.G. Yacobi, D.B. Holt, Cathodoluminescence Microscopy of Inorganic Solids (Plenum, New York, 1990)
S. Chichibu, K. Wada, S. Nakamura, Appl. Phys. Lett., 71, 2346 (1997)
V. Pérez-Solórzano, A. Gröning, M. Jetter, T. Riemann, J. Christen, Appl. Phys. Lett. 87, 163121 (2005)
A. Steckenborn, H. Munzel, D. Bimberg, J. Lumin. 24–25, 351 (1981)
M. Fischer, S. Srinivasan, F.A. Ponce, B. Monemar, F. Bertram, J. Christen, Appl. Phys. Lett. 93, 151901 (2008)
M. Merano, S. Sonderegger, A. Crottini, S. Collin, P. Renucci, E. Pelucchi, A. Malko, M. H. Baier, E. Kapon, B. Deveaud, J.-D. Ganie‘re, Nature, 438, 479 (2005)
M. Merano, S. Sonderegger, A. Crottini, S. Collin, E. Pelucchi, P. Renucci, A. Malko, M.H. Baier, E. Kapon, J.D. Gganière, B. Deveaud, Appl. Phys. B 84, 343 (2006)
F. Urbach, Phys. Rev. 92, 1324 (1953)
J. Nunnenkamp, J.H. Collet, J. Klebiczki, J. Kuhl, K. Ploog, Phys. Rev. B, 43, 14047 (1991)
J. Mickevičius, M.S. Shur, R.S. Qhalid Fareed, J.P. Zhang, R. Gaska, G. Tamulaitis, Appl. Phys. Lett. 87, 241918 (2005)
A. Gustafsson, M.-E. Pistol, L. Montelius, L. Samuelson, J. Appl. Phys. 84, 1715 (1998)
K.H. Gulden, H.Lin, P. Kiesel, P. Riel, G.H. Dohler, K.J. Eberling, Phys. Rev. Lett. 66, 373 (1991)
A.E. Bulatov, S.G. Tikhodeev, Phys. Rev. B, 46, 15058 (1992)
F.G. Monte, S.W. Da Silva, J.M.R. Cruz, P.M. Morais, A.S. Chaves, Phys. Rev. B, 62, 6924 (2000)
W.F. Brinkman, T.M. Rice, Phys. Rev. B 7, 1508 (1973)
A. Cornet, M. Pugnet, J. Collet, T. Amand, M. Brousseau, J. Phys. Colloques 42 C7–471(1981)
R. Heintzmann, M.G.L. Gustafsson, Nat. Photonics 3, 362 (2009)
K.A. Lidke, B. Riegel, T.M. Jovin, R. Heintzmann, Opt. Express 13, 7052 (2005)
W.E. Moerner, Nat. Methods 3, 781 (2006)
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Tamulaitis, G. (2012). Spatially Resolved Luminescence Spectroscopy. In: Patane, A., Balkan, N. (eds) Semiconductor Research. Springer Series in Materials Science, vol 150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23351-7_7
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