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Spatially Resolved Luminescence Spectroscopy

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Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 150))

Abstract

Spatially resolved luminescence spectroscopy is a useful tool for the study of semiconductors with inhomogeneities of their properties on submicrometer scale and semiconductor nanostructures. In this chapter, basic operation principles, instrumentation, and advantages and disadvantages of micro-photoluminescence (μ-PL), confocal microscopy, scanning near-field optical microscopy (SNOM), and cathodoluminescence (CL) are discussed.

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Correspondence to Gintautas Tamulaitis .

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Tamulaitis, G. (2012). Spatially Resolved Luminescence Spectroscopy. In: Patane, A., Balkan, N. (eds) Semiconductor Research. Springer Series in Materials Science, vol 150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23351-7_7

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  • DOI: https://doi.org/10.1007/978-3-642-23351-7_7

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