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High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

  • David L. SalesEmail author
  • Ana M. Beltrán
  • Juan G. Lozano
  • José M. Mánuel
  • M. Paz Guerrero-Lebrero
  • Teresa Ben
  • Miriam Herrera
  • Francisco M. Morales
  • Joaquín Pizarro
  • Ana M. Sánchez
  • Pedro L. Galindo
  • David González
  • Rafael García
  • Sergio I. Molina
Chapter
Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 150)

Abstract

This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures.

Keywords

Molecular Beam Epitaxy Scanning Transmission Electron Microscopy Electron Energy Loss Spectroscopy Quaternary Alloy Peak Pair 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

This work was supported by the European Commission (SANDiE European Network of Excellence NMP4-CT-2004-500101 and COST MP0805), the Spanish MICINN (TEC2005-05781-C03-02/MIC, TEC2008-06756-C03-02/TEC, and CONSOLIDER CSD2009-00013), and the Junta de Andalucía (Ref. P08-TEP-03516 and P09-TEP-5403) with EU-FEDER cofinancing. The authors would like to thank their collaborators and other coauthors of the articles reviewed here (A.G. Taboada, A.J. Papworth, A. Yáñez, B. Alén, D. Fuster, D.G. Morgan, F. de la Pena, J.M. Ripalda, L. González, L. Kirste, M.F. Chisholm, M.H. Du, M.H. Gass, M. Hopkinson, M. Varela, M. Walls, N.D. Browning, O. Ambacher, P.J. Goodhew, Q.M. Ramasse, R. Aidam, S.B. Zhang, S. Hauguth-Frank, S.J. Pennycook, T. Lim, V. Cimalla, V. Lebedev, and Y. González).

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  • David L. Sales
    • 1
    Email author
  • Ana M. Beltrán
    • 1
  • Juan G. Lozano
    • 1
  • José M. Mánuel
    • 1
  • M. Paz Guerrero-Lebrero
    • 2
  • Teresa Ben
    • 1
  • Miriam Herrera
    • 1
  • Francisco M. Morales
    • 1
  • Joaquín Pizarro
    • 2
  • Ana M. Sánchez
    • 1
  • Pedro L. Galindo
    • 2
  • David González
    • 1
  • Rafael García
    • 1
  • Sergio I. Molina
    • 1
  1. 1.Departamento de Ciencia de los Materiales e I.M. y Q.I., Facultad de CienciasUniversidad de CádizPuerto RealSpain
  2. 2.Departamento de Lenguajes y Sistemas InformáticosUniversidad de CádizPuerto RealSpain

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