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Experimental Technique and Working Modes

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Book cover Kelvin Probe Force Microscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 48))

Abstract

Kelvin probe force microscopy is a scanning probe microscopy technique providing the capability to image the local surface potential of a sample with high spatial resolution. It is based on the non-contact atomic force microscope and minimizes the electrostatic interaction between the scanning tip and the surface. The two main working modes are the amplitude modulation and the frequency modulation mode, in which the electrostatic force or the electrostatic force gradient are minimized by the application of a dc bias voltage, respectively. For metals and semiconductors, the contact potential difference is determined, which is related to the sample’s work function, while for insulators information about local charges is obtained. This chapter provides a brief introduction to non-contact atomic force microscopy and describes the details of the various Kelvin probe force microscopy techniques.

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Notes

  1. 1.

    In principle, the definition of the CPD could also be selected as \({V }_{\mathrm{CPD}} = ({\Phi }_{\mathrm{tip}} - {\Phi }_{\mathrm{sample}})/e\), which corresponds to − V CPD of (2.13). We selected the definition of (2.13) such that the changes in V CPD directly correspond to changes in the work function. Thus, images of V CPD represent the same contrast as images of the sample’s work function Φ sample, just with a constant absolute offset, which is equal to the work function of the tip. In the experimental realization this would correspond to a situation, where the voltage is applied to the sample and the tip is grounded (see Sect. 2.7).

References

  1. D.W. Abraham, C. Williams, J. Slinkman, H.K. Wickramasinghe, J. Vac. Sci. Technol. B 9, 703 (1991)

    Article  CAS  Google Scholar 

  2. T.R. Albrecht, P. Grütter, D. Horne, D. Rugar, J. Appl. Phys. 69, 668 (1991)

    Article  Google Scholar 

  3. G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel, Phys. Rev. Lett. 49, 57 (1982)

    Article  Google Scholar 

  4. G. Binnig, C.F. Quate, Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986)

    Article  Google Scholar 

  5. H.-J. Butt, M. Jaschke, Nanotechnology 6, 1 (1995)

    Article  Google Scholar 

  6. J. Colchero, A. Gil, A.M. Baró, Phys. Rev. B 64, 245403 (2001)

    Article  Google Scholar 

  7. B.V. Derjaguin, V.M. Muller, Y.P. Toporov, J. Colloid. Interf. Sci. 53, 314 (1975)

    Article  CAS  Google Scholar 

  8. R. Dianoux, F. Martins, F. Marchi, C. Alandi, F. Comin, J. Chevrier, Phys. Rev. B 68, 045403 (2003)

    Article  Google Scholar 

  9. G.H. Enevoldsen, Th. Glatzel, M.C. Christensen, J.V. Lauritsen, F. Besenbacher, Phys. Rev. Lett. 100, 236104 (2008)

    Article  CAS  Google Scholar 

  10. R. García, R. Pérez, Surf. Sci. Rep. 47, 197 (2002)

    Article  Google Scholar 

  11. F.J. Giessibl, Phys. Rev. B 56, 16010 (1997)

    Article  CAS  Google Scholar 

  12. Th. Glatzel, S. Sadewasser, M.Ch. Lux-Steiner, Appl. Sur. Sci. 210, 84 (2003)

    Article  CAS  Google Scholar 

  13. T. Hochwitz, A.K. Henning, C. Levey, C. Daghlian, J. Slinkman, J. Vac. Sci. Technol. B 14, 457 (1996)

    Article  CAS  Google Scholar 

  14. T. Hochwitz, A.K. Henning, C. Levey, C. Daghlian, J. Slinkman, J. Never, P. Kaszuba, R. Gluck, R. Wells, J. Pekarik, R. Finch, J. Vac. Sci. Technol. B 14, 440 (1996)

    Article  CAS  Google Scholar 

  15. J.N. Israelachvili, Intermolecular and Surface Forces (Academic, London, 1992)

    Google Scholar 

  16. S. Kawai, H. Kawakatsu, Appl. Phys. Lett 89, 013108 (2006)

    Article  Google Scholar 

  17. L. Kelvin, Phil. Mag. 46, 82 (1898)

    Google Scholar 

  18. A. Kikukawa, S. Hosaka, R. Imura, Appl. Phys. Lett. 66, 3510 (1995)

    Article  CAS  Google Scholar 

  19. A. Kikukawa, S. Hosaka, R. Imura, Rev. Sci. Instrum. 67, 1463 (1996)

    Article  CAS  Google Scholar 

  20. Y. Martin, C.C. Williams, H.K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987)

    Article  CAS  Google Scholar 

  21. Y. Martin, D.W. Abraham, H.K. Wickramasinghe, Appl. Phys. Lett. 52, 1103 (1988)

    Article  Google Scholar 

  22. F. Müller, A.-D. Müller, M. Hietschold, S. Kämmer, Meas. Sci. Technol. 9, 734 (1998)

    Article  Google Scholar 

  23. M. Nonnenmacher, M.P. O’Boyle, H.K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991)

    Article  Google Scholar 

  24. R. Pérez, M.C. Payne, I. Stich, K. Terukura, Phys. Rev. Lett. 78, 678 (1997)

    Article  Google Scholar 

  25. P.A. Rosenthal, E.T. Yu, R.L. Pierson, P.J. Zampardi, J. Appl. Phys. 87, 1937 (1999)

    Article  Google Scholar 

  26. Y. Rosenwaks, R. Shikler, Th. Glatzel, S. Sadewasser, Phys. Rev. B 70, 085320 (2004)

    Article  Google Scholar 

  27. S. Sadewasser, M.Ch. Lux-Steiner, Phys. Rev. Lett. 91, 266101 (2003)

    Article  Google Scholar 

  28. K. Sajewicz, F. Krok, J. Konior, Jpn. J. Appl. Phys. 49, 025201 (2010)

    Article  Google Scholar 

  29. R. Shikler, T. Meoded, N. Fried, Y. Rosenwaks, Appl. Phys. Lett. 74, 2972 (1999)

    Article  CAS  Google Scholar 

  30. R. Shikler, T. Meoded, N. Fried, B. Mishori, Y. Rosenwaks, J. Appl. Phys. 86, 107 (1999)

    Article  CAS  Google Scholar 

  31. Ch. Sommerhalter, Dissertation, Freie Universität Berlin (1999)

    Google Scholar 

  32. Ch. Sommerhalter, Th.W. Matthes, Th. Glatzel, A. Jäger-Waldau, M.Ch. Lux-Steiner, Appl. Phys. Lett. 75, 286 (1999)

    Article  CAS  Google Scholar 

  33. Ch. Sommerhalter, Th. Glatzel, Th.W. Matthes, A. Jäger-Waldau, M.Ch. Lux-Steiner, Appl. Surf. Sci. 157, 263 (2000)

    Article  CAS  Google Scholar 

  34. J.M.R. Weaver, D.W. Abraham, J. Vac. Sci. Technol. B 9, 1559 (1991)

    Article  CAS  Google Scholar 

  35. C.C. Williams, Annu. Rev. Mater. Sci. 29, 471 (1999)

    Article  CAS  Google Scholar 

  36. M. Yan, G.H. Bernstein, Ultramicroscopy 106, 582 (2006)

    Article  CAS  Google Scholar 

  37. U. Zerweck, Ch. Loppacher, T. Otto, S. Grafström, L.M. Eng, Phys. Rev. B 71, 125424 (2005)

    Article  Google Scholar 

  38. L. Zitzler, S. Herminghaus, F. Mugele, Phys. Rev. B 66, 155436 (2002)

    Article  Google Scholar 

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Authors and Affiliations

  1. International Iberian Nanotechnology Laboratory - INL, Avda. Mestre José Veiga s/n, 4715-330, Braga, Portugal

    S. Sadewasser

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  1. S. Sadewasser
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Correspondence to S. Sadewasser .

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Editors and Affiliations

  1. Laboratory, International Iberian Nanotechnology, Avda. Mestre José Veiga s/n, Braga, 4715-330, Portugal

    Sascha Sadewasser

  2. Inst. Physik, Universität Basel, Klingelbergstr. 82, Basel, 4056, Switzerland

    Thilo Glatzel

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Sadewasser, S. (2012). Experimental Technique and Working Modes. In: Sadewasser, S., Glatzel, T. (eds) Kelvin Probe Force Microscopy. Springer Series in Surface Sciences, vol 48. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22566-6_2

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