Abstract
Kelvin Probe Force Microscopy (KPFM) has proven its ability to map the surface electrostatic potential at nanometer scale with a resolution of a few mV. Recently, even atomic-scale details in KPFM images have been reported; however, complete understanding of basic processes leading to such resolution is still not developed. Within this chapter experimental and theoretical works dealing with atomic and molecular resolution are reviewed and presented. Recent studies have shown that the atomic-scale contrast in KPFM can be attributed to short-range electrostatic forces. The electrostatic interaction is therefore strongly influenced by the geometrical and chemical composition of the tip-apex. Nevertheless, it will be shown, that site-dependent information of the electrostatic interaction can be drawn down to the atomic scale. In KPFM a detailed analysis of the cross talk between the height measurement and the detected electrostatic forces is unavoidable. Therefore, possible influences and error sources will also be introduced and discussed.
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Glatzel, T. (2012). Measuring Atomic-Scale Variations of the Electrostatic Force. In: Sadewasser, S., Glatzel, T. (eds) Kelvin Probe Force Microscopy. Springer Series in Surface Sciences, vol 48. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22566-6_13
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