Abstract
The Kelvin probe force microscope allows to image surface electronic properties, namely the contact potential difference (CPD) with nanometer scale resolution. With the steadily increasing variety of applications and materials investigated, the increasing trend of research performed applying this techniques is foreseen to continue.
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Sadewasser, S., Glatzel, T. (2012). Introduction. In: Sadewasser, S., Glatzel, T. (eds) Kelvin Probe Force Microscopy. Springer Series in Surface Sciences, vol 48. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22566-6_1
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DOI: https://doi.org/10.1007/978-3-642-22566-6_1
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